Method for verifying single particle soft error protection design based on heavy ion accelerator

Abstract

The invention discloses a method for verifying a single particle soft error protection design based on a heavy ion accelerator, and relates to the field of heavy ion and proton equivalent test verification of system single particle protection effect verification based on accelerator test data. The method includes the following steps: (1) adopting a ground accelerator heavy ion test which is determined on the basis of a LET value; (2) analyzing a proton static overturning cross section; (3) analyzing a sensitive bit factor of the system under any working mode; (4) analyzing a dynamic overturning cross section of the system under heavy ion radiation; (5) analyzing a dynamic overturning cross section of the system under proton radiation. The invention provides a method for verifying a single particle soft error protection design based on the heavy ion accelerator. The method can be intended for verifying single particle protection effects, and address the problems of tight time of domestic accelerators and difficulty in realizing high energy proton tests.

Description

technical field [0001] The invention relates to the field of heavy ion and proton equivalent test verification of system single particle protection effect verification based on accelerator test data, in particular to a design verification method of single particle soft error protection based on heavy ion accelerator. Background technique [0002] Heavy ions and protons in the satellite operating space will produce single event effects in semiconductor logic devices. In order to ensure the reliable and stable operation of satellites in orbit, the system must be designed for single event effect protection. In order to ensure the effectiveness of the protection design effect, generally Verify the design effect of single event soft error protection to confirm that the single event error rate of the system meets the requirements. [0003] Large-scale logic devices are large in scale, and the threshold for single event effects is generally relatively low. The risk of single event ...

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Problems solved by technology

[0013] The purpose of the present invention is to overcome the above-mentioned deficiencies of the prior art, and provide a single-particle soft-error protection design verification method based on heavy ion accelerators, which can be used for single-particle protection effect verification, and solve the time constraints of domestic accelerators and the difficulty in realizing high-energy protons. test question

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