Automatic test system with shared resources and operation mechanism thereof

Abstract

The invention discloses an automatic test system with shared resources and an operation mechanism thereof. The automatic test system with shared resources comprises a test service platform and a plurality of test service terminals. The test service platform comprises a test control computer and an instrument resource. The instrument resource is connected with the test control computer via a standard instrument bus. The test channel of the instrument resource is connected with each test service terminal via a switch resource. Each test service terminal comprises a client connected with the test control computer via a network resource, and a plurality of sensors installed on tested objects. The signal output end of each sensor is connected with the other end of the switch resource via an adapter and a connector. The resources of the automatic test system are shared by all tested objects and the test efficiency of the automatic test system is greatly increased. The automatic test system is applicable to any demanded test task.

Description

technical field [0001] The invention belongs to the field of automatic testing, relates to an automatic testing system for resource sharing, and simultaneously provides an operation mechanism of the automatic testing system for resource sharing. Background technique [0002] Automatic test system (Automatic Test System, ATS) plays an important role in the whole life cycle of the design, manufacture and maintenance of weaponry and industrial products. With the increasing complexity of high-tech products, automatic test systems have been widely used in important fields such as aviation, aerospace, weaponry, energy, etc., and have become a necessary guarantee for the reliable operation of complex systems and equipment. There are two common existing automatic test systems: portable automatic test system and general automatic test system, among which portable automatic test system, such as figure 1 As shown, it is mainly composed of multiple sensors, conditioning modules, data a...

AI Technical Summary

Problems solved by technology

But the above-mentioned portable automatic test platform also has the following defects: because the channels of the measured object, sensor, conditioning module, and data acquisition module must be one-to-one correspondence, therefore, its detection function is fixed after the system development is completed. When faced with the tested object with different test requirements from the original one, its function is difficult to further expand

[0007] 1) The test mode is serial test, which is prone to queuing phenomenon: under normal circumstances, due to the high price of the general test platform, a unit often only purchases one, and at the same time purchases multiple adapters according to the needs of the test task

In actual use, the general test platform can be connected to multiple adapters through a connector, but the connector on the general test platform can only be connected to one adapter at a time, that is, once an adapter is connected to the general test platform, the entire general test platform The test resources of the test platform will be exclusively occupied by the adapter. In fact, each adapter generally does not use all test resources when performing test tasks, but only a small part. During the execution of test tasks by the adapter, although there are still There are some idle test resources, but the idle test resources cannot be used by other adaptation or test tasks during this period, and the new adapter or test task must wait until the previous adapter or test task is executed before it can be executed, that is to say, the adapter not only It takes up the test resources it needs, and also takes up all other test resources. During this period, all test resources cannot be used by other adapters or test tasks. Therefore, when facing multiple test tasks in a short period of time, it is difficult to Queuing of multiple adapters or test tasks will occur, resulting in a long time to complete the entire comprehensive test task, and the overall test efficiency is not high

[0008] 2) The effective test time of a single adapter is short: During the execution of the test task of a single adapter, it usually takes a certain amount of time for preparation work. During the preparation work, all test resources in the general test platform are idle, but because there are already adapters Therefore, other adapters can no longer be connected to the connector, which causes most of the time to be wasted on preparations during the test task execution cycle of an adapter, and the effective test time for the test resources required by the adapter in the platform is short

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