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Laser ablation sample chamber

A technology of laser ablation and sample chamber, applied in sample introduction/extraction, preparation of test samples, parts of particle separator tube, etc., can solve problems such as gas path influence, and achieve the effect of avoiding leakage

Active Publication Date: 2016-09-21
MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the existing laser ablation sampling system, the sample chamber can only accommodate a small amount of samples at a time
During the operation, the sample chamber needs to be opened frequently to replace the sample, which easily affects the gas path in the laser ablation sampling system

Method used

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Examples

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Embodiment 1

[0037] refer to figure 1 , figure 1 It is a schematic structural diagram of the laser ablation sample chamber 200 in the embodiment of the present invention. The laser ablation sample chamber 200 includes an inner chamber 210 , an outer chamber 220 and a sample delivery device 230 .

[0038] combine figure 1 and refer to figure 2 , figure 2 for figure 1 Enlarged view of A. The inner chamber 210 has a first gas inlet 211 and a first gas outlet 212 , and a sample inlet 213 and a sample outlet 214 are opened on the inner chamber 210 . The sample delivery device 230 includes a sample support bar 231 that slidably penetrates the inner chamber 210 through the sample inlet 213 and the sample outlet port 214, and is connected with the sample support bar 231 and is used to drive the sample support bar 231 between the sample inlet 213 and the sample outlet port 214. The driving device 232 that slides on the straight line where the sample port 214 is located.

[0039] Both the ...

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Abstract

The invention discloses a laser ablation sample chamber which comprises an inner cavity, an outer cavity and a sample feeding device. The inner cavity is provided with a first air inlet and a first air outlet. A sample inlet and a sample outlet are formed in the inner cavity. The sample feeding device comprises a sample supporting strip which penetrates through the inner cavity in a slidable mode through the sample inlet and the sample outlet, and a driving device connected with the sample supporting strip and used for driving the sample supporting strip to slide on a straight line where the sample inlet and the sample outlet are located. The inner cavity and the sample feeding device are arranged inside the outer cavity. The outer cavity is provided with a second air inlet and a second air outlet. According to the laser ablation sample chamber, automatic replacement of samples is achieved, the sample chamber does not need to be opened frequently, and therefore influences caused when the sample chamber is frequently opened on air ways in a laser ablation sample feeding system are avoided; meanwhile, the pressure difference between the interior and the exterior of the inner cavity is eliminated, and sample particle cloud leakage caused by the pressure difference between the interior and the exterior of the inner cavity is avoided.

Description

technical field [0001] The invention relates to the technical field of inorganic element and isotope analysis and testing, in particular to a pretreatment device for inductively coupled plasma mass spectrometry, and in particular to a sample chamber in a laser ablation sampling system. Background technique [0002] As a new in-situ sampling technology, laser ablation can be used in conjunction with various analytical instruments such as inductively coupled plasma mass spectrometry. Laser ablation can effectively avoid the problems of sample destruction caused by traditional wet digestion sample preparation, tedious and time-consuming sample preparation, loss of volatile analytes, and polyatomic ion interference caused by water and acid in the digestion solution. [0003] However, in the existing laser ablation sampling system, the sample chamber can only accommodate a small amount of samples at a time. During the operation, the sample chamber needs to be opened frequently t...

Claims

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Application Information

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IPC IPC(8): G01N1/44H01J49/04
CPCG01N1/44H01J49/04
Inventor 文明何康昊宋江锋姚勇李佩龙邓立杨雷
Owner MATERIAL INST OF CHINA ACADEMY OF ENG PHYSICS
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