System on chip and measurement of lowest working voltage of embedded memory of system on chip

Abstract

The invention discloses a system on chip and the measurement of the lowest working voltage of an embedded memory of the system on chip. The system on chip comprises a CPU (Central Processing Unit), the embedded memory and a peripheral circuit, wherein a voltage regulator inputs reference voltage, outputs test voltage to the embedded memory and can be connected with a testing machine; the embedded memory is connected with a data comparator; a reference data generator is connected with the data comparator; the data comparator can be connected with the testing machine; a state machine is connected with the embedded memory, the data comparator and a summator / subtracter, and can be connected with the testing machine; and the summator / subtracter is connected with the voltage regulator. In a process that the lowest working voltage of the embedded memory of the system on chip is measured, the built-in voltage regulator of the system on chip is adopted to provide testing voltage for the embedded memory so as to greatly shorten time for waiting for voltage stabilization after the testing voltage is regulated each time, and test efficiency is obviously improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a method and device for measuring the minimum operating voltage of a system-on-chip chip and its embedded memory. Background technique [0002] System on Chip (System on a Chip, System on a Chip, SoC), also known as system-on-a-chip, refers to the technology of integrating a complete system on a single chip and grouping some or all of the necessary electronic circuits. A complete system-on-chip usually includes a CPU (Central Processing Unit, central processing unit), embedded memory, and peripheral circuits. [0003] The minimum working voltage of the memory is an important parameter in the research and development process of various products. For the system on chip, the minimum working voltage of the embedded memory (that is, the processor built in the system on chip) is usually measured in the following way in the prior art. [0004] Such as figure 1 As shown, th...

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Problems solved by technology

[0008] The technical problem solved by the present invention is: in the process of measuring the minimum operating voltage of the embedded memory of the system-on-chip chip, how to reduce the adverse effect on the test efficiency caused by the time for waiting for the voltage to stabilize after the test voltage is adjusted

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