Light beam transverse micro-displacement generation system based on spin Hall effect of light and MIM structure
A technology of Hall effect and lateral displacement, applied in the direction of using optical devices, material analysis through optical means, measuring devices, etc., can solve the problems that the reflection coefficient is difficult to approach zero, the influence ratio, and the TE light reflection coefficient are not high, and achieve Enhanced spin Hall effect, easy to adjust the effect
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[0032] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.
[0033] Using the polarization-dependent characteristics of the guided mode excitation of the MIM waveguide structure, one polarization satisfies the phase matching condition, and the amplitude of its reflection coefficient approaches zero, while the other polarization has a very high amplitude of reflection coefficient. Under such conditions, submillimeter or even millimeter lateral displacements can be produced according to the optical spin Hall effect. Since the excitation conditions of the guided mode of the MIM are closely related to the wavelength, polarization, incident angle of the beam and the structural parameters of the MIM waveguide, adjusting any parameter can modulate the lateral displacement of the beam.
[0034] The MIM waveguide st...
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