Light beam transverse micro-displacement generation system based on spin Hall effect of light and MIM structure
A technology of Hall effect and lateral displacement, applied in the direction of using optical devices, material analysis through optical means, measuring devices, etc., can solve the problems that the reflection coefficient is difficult to approach zero, the influence ratio, and the TE light reflection coefficient are not high, and achieve Enhanced spin Hall effect, easy to adjust the effect
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[0032] In order to make the technical means, creative features, objectives and effects of the present invention easy to understand, the present invention will be further explained below in conjunction with specific embodiments.
[0033] Utilizing the polarization correlation characteristics of the guided mode excitation of the MIM waveguide structure, one polarization meets the phase matching condition, and the amplitude of its reflection coefficient approaches zero, while the other polarization has a high reflection coefficient amplitude. Under this condition, according to the optical spin Hall effect, lateral displacement of the order of sub-millimeter or even millimeter can be generated. Because the guided mode excitation conditions of MIM are closely related to the wavelength, polarization, incident angle and structural parameters of the MIM waveguide, adjusting any parameter can modulate the lateral displacement of the beam.
[0034] The MIM waveguide structure is a three-laye...
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