Fabrication method of semiconductor mode-locked laser based on full quantum well selective region epitaxy

A technology of selective area epitaxy and mode-locked lasers, which is applied in the direction of semiconductor lasers, lasers, phonon exciters, etc., can solve the problems of poor device aging performance, large material damage, and low yield, and achieve good material aging performance, The effect of compressing pulse width and reducing time domain jitter

Active Publication Date: 2019-01-18
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These two technologies require additional docking and quantum well hybrid processes respectively, and the damage to the material is large, which makes the aging performance of the device poor, and the process is complicated and the yield is not high.

Method used

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  • Fabrication method of semiconductor mode-locked laser based on full quantum well selective region epitaxy
  • Fabrication method of semiconductor mode-locked laser based on full quantum well selective region epitaxy
  • Fabrication method of semiconductor mode-locked laser based on full quantum well selective region epitaxy

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preparation example Construction

[0034] The present invention proposes a semiconductor mode-locked laser preparation method based on full quantum well selective region epitaxy, which includes:

[0035] Step 1: Prepare a selected area epitaxial mask strip with a predetermined size and predetermined material according to the required mode-locking pulse width and repetition frequency, the predetermined size includes the length, width, deposition thickness, and thickness of the selected area epitaxial mask strip. The length ratio of the mask and the non-mask area, the inclination angle of the mask (relevant to the wedge-shaped and trapezoidal mask structure), the predetermined material includes the dielectric material SiO or SiN, etc., such as figure 1 with figure 2 shown.

[0036] figure 1 Each figure in the figure relates to the core key structure of the present invention, including uniform and non-uniform selective epitaxial mask patterns, single-arm, symmetrical double-arm, asymmetric double-arm external c...

example 1

[0064] At a doping concentration of 5×10 18 cm -3 N-type InP substrate (attached Figure 5 , layer 4) epitaxial one layer of 200nm N-type doped InP epitaxial buffer layer (attached Figure 5 , layer 3); Deposit one deck of 200nm thick SiO2 dielectric layer mask on the epitaxial chip, according to the application requirements, for the required mode-locking pulse width and repetition rate, select the appropriate mask pattern ( In Table A. figure 1 , 3 , 5, 8) make a mask plate; photolithography mask pattern, the mask pattern is transferred to the dielectric layer; in the chamber of 100mbar, 675 ℃, with the mask pattern epitaxial full quantum well structure (attached Figure 5 , layer 2); the wavelength of the epitaxial quantum well is designed around 1550nm or 1310nm, so that the output wavelength of the mode-locked pulse is in the low-loss window of optical fiber transmission, which meets the transmission requirements of optical fiber communication; after that, take out the...

example 2

[0066] At a doping concentration of 5×10 18 cm -3 N-type InP substrate (attached Figure 5 , layer 4) epitaxial one layer of 200nm N-type doped InP epitaxial buffer layer (attached Figure 5 , layer 3); Deposit a 150nm thickness SiO2 dielectric layer mask on the epitaxial chip, according to the application needs, for the required mode-locking pulse width and repetition rate, select the appropriate mask pattern (table) in the attached table 1 A. in figure 1 , 3 , 5, 8) make a mask plate; photolithography mask pattern, the mask pattern is transferred to the dielectric layer; in the chamber of 200mbar, 675 ℃, with the mask pattern epitaxial full quantum well structure (attached Figure 5 , layer 2); the wavelength of the epitaxial quantum well is designed at 1053nm, so that the waveband of the mode-locked pulse output is within the waveband range of the corneal surgery laser knife; the epitaxial film is taken out, and the SiO2 dielectric layer is drifted off by wet BOE, and the...

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Abstract

The invention discloses a method for manufacturing a semiconductor mode-locked laser based full quantum well selective area epitaxy. The method comprises the steps of 1, designing a selective area epitaxy mask; 2, selecting an epitaxy pattern for production; 3, performing selective area epitaxial growth; 4, manufacturing a laser cavity structure; 5, performing electrical isolation; 6, manufacturing electrodes; and 7, cleaving to obtain a tube core laser. Through one selective area epitaxy, definition of a gain area, a saturated absorption area and an active and passive cavity proportion of the mode-locked laser, and a colliding pulse mode-locking principle, the pulse width is compressed and the mode-locked frequency is improved; and through a passive external cavity technology, the time-domain jitter of pulse repetition frequency is reduced, and stable output of the repetition frequency (which can be high and low based on using demands) of narrow pulses is finally realized.

Description

technical field [0001] The invention relates to the design and manufacture of a novel semiconductor external cavity mode-locked laser, in particular to the application of selective area epitaxy technology of core quantum well materials in the output pulse compression and external cavity extension of the semiconductor mode-locked laser. Background technique [0002] Semiconductor mode-locked laser is the core technology of semiconductor pulse light source manufacturing. As a narrow pulse light source with tunable repetition rate design, semiconductor mode-locked lasers can be applied in the fields of optical communication, biomedicine, or femtosecond chemical research. [0003] Existing semiconductor mode-locking technologies mainly include two categories: active mode-locking and passive mode-locking. Active mode-locking is injected by an external microwave source, so the repetition frequency of the pulse is very stable in the frequency domain, and the time jitter is small. ...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): H01S5/065H01S5/343
CPCH01S5/0657H01S5/343
Inventor许俊杰梁松朱洪亮
OwnerINST OF SEMICONDUCTORS - CHINESE ACAD OF SCI