D trigger

Abstract

An embodiment of the invention provides a D trigger and relates to the field of a trigger. The D trigger comprises a signal delay circuit, a time delay capacitor is installed in the signal delay circuit, a load capacitor is installed in the signal delay circuit, and rise time and fall time of an input pulse can be further increased by utilizing charging and discharging functions of the capacitor, so an anti-signal-particle flip ability of the D trigger is enhanced.

Description

technical field [0001] The present invention relates to the field of flip-flops, in particular to a D flip-flop. Background technique [0002] In cosmic space, there are a large number of high-energy particles (protons, electrons, heavy ions) and charged particles. After the integrated circuit is bombarded by these high-energy particles and charged particles, an electronic pulse will be generated in the integrated circuit, which may cause the original level of the internal node of the integrated circuit to flip. This effect is called single event flip. If the incident of a single particle causes the storage information of multiple nodes in the sequential circuit to flip simultaneously, it will cause the circuit to produce a multi-node flip effect (Multiple NodeUpset, MNU). The higher the linear energy transfer (LET) value of the single event bombarding the integrated circuit, the easier it is to produce single event flipping and multi-node flipping effects. Both single-eve...

AI Technical Summary

Problems solved by technology

But the anti-single-event turnover ability of the D flip-flop in the prior art is still not high enough

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