Three-dimensional measurement method suitable for bright surface
Patent Information
- Authority / Receiving Office
- CN Β· China
- Current Assignee / Owner
- SHAOGUAN COLLEGE
- Publication Date
- 2016-11-09
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Abstract
Description
technical field
[0001] The invention relates to an optical measurement method, in particular to a structured light three-dimensional measurement method. Background technique
[0002] The structured light method is an active optical measurement method. Its basic principle is to project a controllable light point, light bar or light surface on the surface of the measured object by a structured light projector, and collect images by an image sensor (such as a camera). Through the geometric relationship of the system, the three-dimensional coordinates of the object are calculated by using the triangulation principle. The structured light measurement method is widely used in product quality inspection, reverse engineering (digitization of complex free-form surfaces), object recognition, 3D map construction, biomedicine and cultural relics protection due to its advantages of non-contact, full-field scanning, high precision, and fast measurement speed field.
[0003] However, whe...