Three-dimensional measurement method suitable for bright surface

A three-dimensional measurement and bright technology, applied in the field of optical measurement, can solve the problems of coating thickness and uniformity measurement error, spraying and cleaning coating to reduce measurement efficiency, increase the complexity of hardware system, etc. Intervention, low cost effect

Active Publication Date: 2016-11-09
SHAOGUAN COLLEGE +1
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Problems solved by technology

But for the surface of the metal workpiece, the diffusely reflected light is weak and the signal-to-noise ratio is low, which will lead to a significant decrease in measurement accuracy; in addition, adding a polarizer increases the complexity of the hardware system
Some scholars use the method of spraying a thin anti-reflection coating on the surface of the measured object to change the reflection property of the su

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  • Three-dimensional measurement method suitable for bright surface
  • Three-dimensional measurement method suitable for bright surface
  • Three-dimensional measurement method suitable for bright surface

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Embodiment Construction

[0044] The main steps of the three-dimensional measurement method applicable to bright surfaces of the present invention can be briefly summarized as follows:

[0045] Step 1: Project a series of uniform light patterns with different gray values ​​to the measured object, and take corresponding uniform light images of the measured object.

[0046] Step 2: Calculate the optimal projected gray value of each pixel to generate the optimal gray value fringe pattern.

[0047] Step 3: Project the optimal gray value fringe pattern to the measured object, and correspondingly capture the optimal gray value fringe image of the measured object.

[0048] Step 4: Decoding the optimal gray value fringe image, solving the three-dimensional coordinates and surface reconstruction, and recovering the three-dimensional shape of the measured object.

[0049] Specifically, the three-dimensional measurement method applicable to bright surfaces of the present invention includes the following steps:

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Abstract

The invention discloses a three-dimensional measurement method suitable for a bright surface. According to images synthesized through uniform-light patterns and coordinate mapping, an optimal projection gray value of each pixel point in a stripe pattern is adaptively adjusted, when the method is used for measuring three-dimensional morphology comprising large-scope reflectivity change, for a bright area with high reflectivity, image saturation can be avoided, for a dark area with low reflectivity, a quite high signal-to-noise ration can be maintained, finally, clear stripe pattern images can be obtained, and the three-dimensional morphology of a measured object can be accurately restored.

Description

technical field [0001] The invention relates to an optical measurement method, in particular to a structured light three-dimensional measurement method. Background technique [0002] The structured light method is an active optical measurement method. Its basic principle is to project a controllable light point, light bar or light surface on the surface of the measured object by a structured light projector, and collect images by an image sensor (such as a camera). Through the geometric relationship of the system, the three-dimensional coordinates of the object are calculated by using the triangulation principle. The structured light measurement method is widely used in product quality inspection, reverse engineering (digitization of complex free-form surfaces), object recognition, 3D map construction, biomedicine and cultural relics protection due to its advantages of non-contact, full-field scanning, high precision, and fast measurement speed field. [0003] However, whe...

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Application Information

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IPC IPC(8): G01B11/25
CPCG01B11/25
Inventor 林辉高健王伟张观锦
Owner SHAOGUAN COLLEGE
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