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Deformation measurement and control experimental system of thin film structure

A thin-film structure and control experiment technology, applied in general control systems, control/regulation systems, measurement devices, etc., can solve the problems of inability to verify the validity of control algorithms, inability to adjust in real time, and low reliability

Active Publication Date: 2019-02-22
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

However, the existing methods are not adjustable, and cannot be adjusted in real time during orbital flight to meet the high-precision surface requirements of the film front.
In addition, at present, this problem is mainly studied through theoretical simulation, but the theoretical simulation verification is based on many approximate assumptions, the reliability is not high, and the effectiveness of the control algorithm cannot be fully verified.

Method used

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  • Deformation measurement and control experimental system of thin film structure
  • Deformation measurement and control experimental system of thin film structure
  • Deformation measurement and control experimental system of thin film structure

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Embodiment Construction

[0020] refer to figure 1 , The present invention provides a film structure deformation measurement and control experiment system, including a film structure test piece 1, a deformation measurement system 2, a deformation control system 3 and a monitoring control system 4. The thin film structure test piece 1 includes a thin film front 13 and a ball screw adjustment mechanism 14 capable of adjusting the shape of the thin film front 13. The deformation measurement system includes two photogrammetric cameras. Shoot the film front at different angles, and send the captured images to the monitoring and control system. The monitoring and control system obtains the three-dimensional surface data of the film front through image processing and transmits the data to the deformation control system. The deformation control system according to the three-dimensional surface The data calculates the required adjustment amount of the film front, and drives the ball screw adjustment mechanism t...

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Abstract

The invention provides a thin film structure deformation measurement and control experiment system, including a thin film structure test piece, a deformation measurement system, a deformation control system and a supervision control system. The thin film structure test piece comprises a thin film array plane and an adjusting mechanism capable of adjusting the shape of the thin film array plane. The deformation measurement system comprises two photogrammetric cameras. The two photogrammetric cameras are adopted for shooting the thin film array plane at two different angels and send captured imaged to the supervision control system. The supervision control system obtains three-dimensional shape data of the thin film array plate through image processing and transmits the three-dimensional shape data to the deformation control system. The deformation control system calculates required adjustment amount based on the three-dimensional shape data and drives an adjustment mechanism to an assigned position, thereby achieving flatness control of the thin film array plane. The thin film structure deformation measurement and control experiment system can simulate a real controlled object, fully verify the adopted control method, and overcome the problem of low theoretical simulation credibility.

Description

technical field [0001] The invention relates to the field of deformation control of spacecraft structures, in particular to a deformation measurement and control experiment system of a thin film structure. Background technique [0002] Thin-film structures, such as solar sails, thin-film solar cell arrays, thin-film antenna structures, thin-film mirror structures, etc., have been more and more widely used in the aerospace field due to their advantages of large area, light weight, and small storage volume. Due to the large area of ​​the film structure, low stiffness, and weak damping, it is prone to deformation under interference conditions such as thermal loads, attitude maneuvering loads, and orbital maneuvering loads, and its shape and surface accuracy is difficult to maintain. However, the reduction of the surface accuracy of the film will seriously affect the implementation of space missions, or lead to a decline in work performance. [0003] In the existing solutions, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B17/02G01B11/16
CPCG01B11/16G05B17/02
Inventor 许睿李东旭蒋建平邹杰刘望
Owner NAT UNIV OF DEFENSE TECH
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