A carrier and carrier system for batch testing of photoelectric detectors

Abstract

The invention discloses a load plate for batch testing of photoelectric detectors and a load plate system. The load plate for batch testing comprises multiple chip slots distributed in an array mode, air holes, an air suction hole, signal-end metal piles, signal-end metal leads, signal output contact slots, power-end metal piles, power-end metal leads and power input contact slots. The chip slots, the air holes and the air suction hole are used for fixing the photoelectric detectors to be tested; the signal-end metal piles, the signal-end metal leads and the signal output contact slots are used for reading measurement signals of the photoelectric detectors to be tested; the power-end metal piles, the power-end metal leads and the power input contact slots are used for supplying power to the photoelectric detectors to be tested. The load plate can quickly and efficiently test hundreds of the photoelectric detectors simultaneously and can quickly read multiple testing quantities conveniently to quickly count and analyze the testing quantities conveniently.

Description

technical field [0001] The invention relates to the field of microelectronics and optoelectronic testing, in particular to a batch testing carrier and carrier system that can be used to simultaneously detect or test a plurality of photodetectors. Background technique [0002] The detection or testing of photodetectors involves the measurement of electrical and optical quantities. At present, the measurement method of photoelectric detectors generally adopts a single product test carrier. The tester puts a single detector to be tested on a single product test carrier and fixes it, and then assembles it into the test system, and performs electrical measurements such as current and voltage in turn. Measurement of optical quantities such as measurement and spectral response. The method of measuring with a single test carrier is inefficient, time-consuming and laborious, and because the detectors to be tested need to be replaced continuously, it is impossible to realize the simu...

AI Technical Summary

Problems solved by technology

The measurement efficiency of a single test carrier is low, time-consuming and laborious, and because the detectors to be tested need to be replaced continuously, it is impossible to realize the simultaneous measurement of multiple detectors, which is not conducive to large-scale testing

In addition, due to the use of a single test carrier, the test results are relatively scattered, which is not conducive to systematic statistical analysis of photodetectors manufactured in the same batch

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