Optimization grouping method of multifrequency electromagnetic sensitivity test

Abstract

The invention relates to an optimization grouping method of a multifrequency electromagnetic sensitivity test. The method comprises the steps of (1) obtaining test information, and calculating the testing frequency of a tested product, wherein the total number of the testing frequency of the tested product is A, and a user gives the number B of possible largest sensitive frequencies of a tested product, (2) obtaining a grouping parameter, giving an optimal grouping condition, which means that the grouping times of the test is ln (A / B)-1, and the group number of each time of grouping is eB, (3) carrying out grouping testing, dividing all frequencies to be tested into eB groups, the sensitivity test of each group is carried out, and removing a frequency comprised by a group which does not expresses a sensitive phenomenon after the test is ended, (4) repeating the step (3) for ln (A / B)-1 times, and (5) carrying out successive testing of the remaining frequencies of a grouping test after the grouping test and judging whether the frequencies are sensitive frequencies or not. According to the method, the range of test frequency number is reduced, and thus the efficiency of the grouping testing is improved.

Description

technical field [0001] The invention relates to an optimized grouping method for a multi-frequency electromagnetic sensitivity test, belonging to the technical field of sensitivity testing. Background technique [0002] As a very prominent element in electronic products, electromagnetic compatibility requires equipment to have electromagnetic sensitivity and electromagnetic emission capabilities that meet the corresponding standards. In order to investigate the electromagnetic susceptibility of equipment, GJB 151B-2013 provides regulations on the test requirements and measurement of electromagnetic susceptibility. When performing step-by-step scanning on the tested product, the device needs to dwell at each tuning frequency for at least 3s or the response time of the tested product (whichever is greater). When the test frequency is high, the test has the problem of taking a long time. [0003] The existing conduction sensitivity multi-frequency test system proposed by Beih...

AI Technical Summary

Problems solved by technology

Since the time-consuming sensitivity test is positively correlated with the number of tests, the multi-frequency group test reduces the number of tests. However, when the test system performs multi-frequency tests, due to the limitation of the output power of the signal source, the frequency selection in each group is limited. On the basis of ensuring the balanced distribution of total power, make the test frequency points in each group as many as possible. Although the test efficiency is improved compared with GJB 151B-2013, the overall test efficiency still cannot meet the actual needs, so the test efficiency needs to be improved

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