35results about How to "Narrow the scope of the test" patented technology

The invention discloses a method for quickly obtaining standard forming parameters of a selective laser melting device, comprising: S1, designing a printing model of a test workpiece, wherein the test workpiece includes an inclined surface structure, a curved surface structure, a side through hole structure and a cantilever beam structure; S2. Print out n on the substrate according to the printing model 1 A test workpiece with the same shape, each test workpiece corresponds to a set of basic forming parameters; S3, detect each test workpiece, and obtain the corresponding inclined surface structural parameters, curved surface structural parameters, side through hole structural parameters and cantilever beam structure parameters; S4, according to the inclined surface structure parameters, curved surface structure parameters, side through hole structure parameters and cantilever beam structure parameters in step S3, obtain the standard forming parameters of the metal powder to be processed, the standard forming parameters include filling Forming parameters, upper surface standard forming parameters and lower surface standard forming parameters. The method of the invention has fast acquisition speed and strong directivity.

The invention discloses a method for testing base station time delay which comprises: a sending step, service data is sent to a tested base station through a Uu air interface; a calculation step, the sum of an uplink physical interweaving and a processing time delay inside the base station and / or the sum of an uplink transmission time delay and a sending time delay of an Iub interface is evaluated according to a combination operation of the time that the service data respectively reaches an FP module of the base station, the time that the data is sent in the Uu air interface and the time thatthe data is sent in the Iub interface. At the same time, the invention also converts the service data into downlink data through the loop-back unit by mounting a loop-back line on an upstream sendingend of the Iub interface, and evaluates the sum of the uplink transmission time delay, the downlink transmission time delay and the sending time delay of the Iub interface by calculating the time difference that the service data is transmitted to the FP module through an uplink transmission and a downlink transmission. The embodiment of the invention can quickly and accurately test the time delayinside the base station and the time delay jitter.

The invention discloses a ground fault location method and a location device of a power distribution line. The distribution line ground fault location method mainly includes: a fast location method for AC and DC signals suitable for no or few branches, a comprehensive location method for AC and DC signals, a fault location method for AC signals, and a fault location method for pulse signals. The distribution line grounding fault location device includes a host and a current patrol device, wherein the host and the current patrol device are both provided with a wireless transmission unit, and the current patrol device can control the host through the wireless transmission unit to realize remote operation of the host. The distribution line ground fault location method and location device provided by the invention have the advantage of high fault location efficiency.

The invention relates to a chemical industry data analysis system based on industrial big data. The method includes: a one-element correlation test module, which is used to test the correlation between each reactant and the purity of a finished product in a certain chemical reaction; a two-element correlation test module , used to test the correlation between two reactants and the purity of the finished product in a certain chemical reaction; the analysis module is used to analyze the correlation between each reactant and the purity of the finished product, and the correlation between the reactant pair and the purity of the finished product property; the integration module is used to analyze and calculate the relationship between the reactants, and find all reactants with mutual repulsion effects; the iterative module is used to continuously search for the reactants with mutual repulsion effects according to the data in the integration module, And treat it as a new reactant until there is no mutual repulsion effect between all reactants in the end; the experimental module is used to carry out actual chemical experiments to calculate the optimal quantitative ratio relationship between each reactant to obtain the highest purity of the finished product .

The invention provides a determining method and device of a software testing range. The method comprises the steps of determining at least two function modules which are included by software to be tested; obtaining at least one metadata used for defining each function module separately; determining influence degree values between each metadata and other metadata according to citation relationships among the metadata; obtaining at least one modified metadata which is modified; determining at least one correlated metadata corresponding to the modified metadata aiming at every modified metadata and according to the influence degree values between the modified metadata and other metadata; determining at least one function module defined by each correlated metadata as the testing range of the software to be tested. The determining device of the software testing range comprises a preset unit, an acquisition unit, a recognition unit and a processing unit. According to the technical scheme, the efficiency in testing the software can be provided.