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Method for preventing flash from being accidentally tampered in use process of SD (Smart Device) based on ECC (Error Correction Code) check

An unexpected, check value technology, applied in the field of smart devices, to achieve a wide range of application prospects, easy to implement, and reduce the effect of usage

Inactive Publication Date: 2016-12-07
SHENZHEN FENGLIAN TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

To reduce accidental tampering of flash from the source, major flash manufacturers are working hard to correct it, but it is unavoidable

Method used

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  • Method for preventing flash from being accidentally tampered in use process of SD (Smart Device) based on ECC (Error Correction Code) check
  • Method for preventing flash from being accidentally tampered in use process of SD (Smart Device) based on ECC (Error Correction Code) check
  • Method for preventing flash from being accidentally tampered in use process of SD (Smart Device) based on ECC (Error Correction Code) check

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0042] Such as Figure 2 to Figure 7 As shown, the method for preventing flash from being accidentally tampered with during SD use based on ECC verification includes the following steps:

[0043] (S1) Generate a bootloader partition in the flash according to the requirements of the SD device;

[0044] (S2) Generate a corresponding ECC check value according to the generated bootloader partition, and save the ECC check value in the bootloader ECC check area generated after the bootloader partition;

[0045] (S3) Generate system kernel and root file system partitions according to SD device requirements;

[0046] (S4) Generate a corresponding ECC check value according to the system kernel and root file partition, and save the ECC check value in the system ECC check area generated after the system kernel and root file partition;

[0047]In order to effectively distinguish the ECC check area and avoid this part of the error during the startup process, the bootloader partition and ...

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PUM

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Abstract

The invention discloses a method for preventing flash from being accidentally tampered in a use process of SD (Smart Device) based on ECC (Error Correction Code) check. The method comprises the following steps: (S1) generating a boot loader partition in the flash; (S2) generating a corresponding ECC check value, and storing the ECC check value in a boot loader ECC check zone established afterwards; (S3) generating a system kernel and a root file system partition; (S4) generating a corresponding ECC check value, and storing the ECC check value in a system ECC check zone established afterwards; (S5) in every starting process, generating, by the SD, a new ECC check value according to every 256 byte data read by the flash, comparing the new ECC check value with the ECC check value which is correspondingly stored in the boot loader ECC check zone or the system ECC check zone of the flash, if the two values are consistent, showing the 256 byte data are normal, and otherwise, recovering the 256 byte data according to an ECC check rule. According to the method disclosed by the invention, the condition that a small amount of bits are tampered and further starting cannot be achieved due to power failure, excessive frequency of flash parameter erasing and the like in a use process of the SD is effectively relieved.

Description

technical field [0001] The invention relates to the technical field of smart devices, in particular to a method for preventing accidental tampering of flash during SD use based on ECC verification. Background technique [0002] At present, many companies are trying the field of smart devices (SD, Smart Device). SD devices have more and more functions, and the hardware integration level is getting higher and higher. However, due to some cost control or imperfect design schemes, as well as some unavoidable reasons (such as sudden power failure), the firmware on the flash (flash memory) is accidentally tampered with during SD use, and SD devices cannot work normally. [0003] During the use of SD, due to the aging of hardware equipment and sudden power failure during normal use, the firmware stored in the flash is accidentally tampered with, making the SD unable to use normally. figure 1 Shown is the conventional flash layout, and the specific SD device manufacturer may be sli...

Claims

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Application Information

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IPC IPC(8): G06F11/10
CPCG06F11/1068
Inventor 崔营周庆伟
Owner SHENZHEN FENGLIAN TECH
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