Structured light based three-dimensional reconstruction system and structured light based three-dimensional reconstruction method

A 3D reconstruction and structured light technology, applied in the field of optical engineering, can solve the problems of low efficiency and high cost, achieve low cost, achieve mass production, and achieve the effect of accurate 3D reconstruction

Inactive Publication Date: 2017-01-04
CHANGAN UNIV
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Problems solved by technology

The contact three-dimensional measurement method represented by the traditional coordinate measuring machine is mature, and the measurement accuracy is high, and it is widely accepted, but it is restricted by high cost, low efficiency, and the requirement to be in contact with the measured object.

Method used

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  • Structured light based three-dimensional reconstruction system and structured light based three-dimensional reconstruction method
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  • Structured light based three-dimensional reconstruction system and structured light based three-dimensional reconstruction method

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Embodiment Construction

[0050] The present invention will be further described below in conjunction with the accompanying drawings.

[0051] see figure 1 and figure 2 , a three-dimensional reconstruction system based on structured light includes a projector 1 and a camera 2 connected to a computer 3, and the computer 3 is connected to a 3D printer 4;

[0052] The projector 1 is used to project the sinusoidal grating image generated by the computer 3 onto the measured object;

[0053] The camera 2 is used to collect the deformed sinusoidal grating image on the measured object and send it to the computer 3;

[0054] The computer 3 is used for data processing of the deformed sinusoidal grating image, firstly solves the phase value through the Fourier transform method, and then calculates the height of the measured object according to the geometric relationship between the projector 1, the camera 2 and the measured object, and finally obtains the measured object Measure the shape of the object and ge...

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Abstract

The invention discloses a structured light based three-dimensional reconstruction system and a structured light based three-dimensional reconstruction method. The method includes: projecting a sinusoidal grating image towards a detected object through a projector, acquiring a deformed grating image through a camera, and performing data processing through a computer to obtain morphology of the detected object and generate a three-dimensional model. The structured light based three-dimensional reconstruction system and the structured light based three-dimensional reconstruction method have advantages of high precision, low cost, easiness in implementation and the like, functions of detected object scanning and model recovery are achieved, precision three-dimensional reconstruction can be realized, and quick batch production is realized as well.

Description

technical field [0001] The invention belongs to the field of optical engineering, and in particular relates to a three-dimensional reconstruction system and method based on structured light. Background technique [0002] In social production and life, three-dimensional measurement has attracted widespread attention. The contact three-dimensional measurement method represented by the traditional coordinate measuring machine has matured and has high measurement accuracy, and is widely accepted, but it is restricted by high cost, low efficiency, and the requirement to be in contact with the measured object. The non-contact three-dimensional measurement method represented by visual three-dimensional detection technology is currently developing rapidly, and has the advantages of high speed, high efficiency, high degree of automation, and low cost. Among them, the three-dimensional measurement method of structured light is recognized as the most practical and potential three-dime...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 刘晶郁杨尉平魏琼
Owner CHANGAN UNIV
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