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A Method of Correcting the Inhomogeneity of Infrared Imaging System

An infrared imaging system, non-uniformity technology, applied in image enhancement, image analysis, image data processing and other directions, to eliminate the effect of non-uniformity and improve quality

Active Publication Date: 2019-04-16
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

It is assumed here that the shutter is uniform, so that the non-uniformity of the infrared focal plane array can be eliminated. However, the actual situation is that the shutter will also produce non-uniformity with the temperature drift of the infrared system.

Method used

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  • A Method of Correcting the Inhomogeneity of Infrared Imaging System

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Embodiment Construction

[0016] The specific steps of the method for correcting the non-uniformity of the infrared imaging system according to the embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

[0017] Due to the trend of miniaturization, the structure and volume of infrared thermal imaging cameras are getting smaller and smaller. One of the problems brought about by miniaturization is the heat dissipation of infrared imaging cameras. Due to the heating of the infrared focal plane array and the heating of the infrared thermal imager's own circuit, the heat is not output in time due to miniaturization. The applicant found that when the infrared thermal imager is used for a long time, even if the shutter is frequently used for correction, the non-uniformity of the infrared image always exists. In addition to the influence of other factors, the non-uniformity of the shutter has a great influence on the Non-uniformity has a dramatic effe...

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Abstract

Embodiments of the present invention provide a method for correcting non-uniformity of an infrared imaging system. The method includes: using an infrared imaging system to respectively image a blackbody with a first temperature, a blackbody with a second temperature and a shutter to obtain first, second and third infrared images, and according to the first, second and first Calculate non-uniformity correction parameters for three infrared images. In the embodiment of the present invention, when calculating the non-uniformity correction parameters, the infrared image data obtained by infrared imaging of the shutter is used, and the influence of the shutter is taken into consideration, which can effectively eliminate the non-uniformity caused by the heat of the shutter. Influence, in the case of using the infrared imaging system for a long time, it can improve the quality of the infrared image.

Description

technical field [0001] The invention relates to the field of infrared imaging systems, in particular to a method for correcting the non-uniformity of the infrared imaging system. Background technique [0002] In the military, agriculture, industry, medical treatment, forest fire prevention, monitoring and so on, the infrared imaging system plays an important role. Infrared imaging system occupies an important position in the scientific research of various countries because of its advantages of high reliability, small size and low power consumption. [0003] However, due to the influence of infrared focal plane array manufacturing materials, mask errors, process conditions and other factors, the infrared imaging system has different detector output amplitudes under the condition of uniform radiation, resulting in non-uniform infrared images. At the same time, the infrared imaging system will also introduce other non-uniform factors, such as the lens, the heating of the syste...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/50G01N21/27
CPCG06T5/50G01N21/274G06T2207/10048G06T5/00
Inventor 周云闫相宏蒋伟杨皓然
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA