A method for detecting the spectral characteristics of a dual-frequency laser interferometer spectroscope
A dual-frequency laser interference and spectroscopic characteristics technology, applied in the field of laser applications, can solve problems such as large nonlinear errors of dual-frequency laser interferometers, errors in measurement results, non-ideal polarization states of circularly polarized light, etc., to achieve high precision and avoid impact Effect
Active Publication Date: 2018-02-27
HARBIN INST OF TECH
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Problems solved by technology
This detection method requires the power of the circularly polarized light used to be stable, and the polarization state is ideal. However, in practice, the circularly polarized light has a problem of non-ideal polarization, which leads to errors in the measurement results.
[0008] To sum up, the unsatisfactory light splitting of the spectroscopic mirror will cause a large nonlinear error in the measurement of the dual-frequency laser interferometer. The influence of the laser light source on the measurement results has not been eliminated, and the non-ideal light source exists in practice, so the existing theoretical model is not perfect, and there are still some deficiencies in technology
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[0030] The present invention is described in detail below with reference to accompanying drawing and preferred implementation example:
[0031] figure 1 It is the schematic diagram of the measurement scheme of the spectroscopic characteristics of the spectroscope. The dual-frequency laser passes through the polarizer and the spectroscope to be tested in sequence. By rotating the polarizer in front of the spectroscope to be tested, the output light intensity of the transmission path and the reflection path after the spectroscope to be tested is split. At the same time, the photoelectric conversion circuit is used to receive the change of the light intensity of the two channels, and the data is recorded by the data acquisition and control circuit, and sent to the upper computer for storage. Subsequent processing of the collected data can calculate the energy transmittance, energy reflectivity and placement error of the spectroscope, as well as the non-orthogonal angle and elliptic...
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Disclosed is a method for detecting spectrophotometric features of a spectroscope of a dual frequency laser interferometer. The method belongs to the technical field of laser application. The method comprises the following steps: double-frequency laser sequentially passes through a polarizer and a to-be-tested spectroscope, and a photodetector is used to receive the light intensity of the transmission path and the reflection path of the to-be-tested spectroscope; and a polarizer is rotated to change the light intensity at the two paths, and the energy transmissivity and reflectivity of the spectroscope, the location rotating angle error, the non-orthogonal angle of the laser source can be solved based on the measured light intensity changing curves of the two paths. The method takes light source errors, location errors and to-be-tested spectrophotometric feature parameters of the spectroscope into account, so as to not only solve the spectrophotometric feature parameters of the spectroscope, but also solve the non-orthogonal angle of the light source with measurement accuracy and reliability. The method can be used in a polarizing spectroscope and a non-polarizing spectroscope, utilizes two-path synchronous measurement, in order to effectively prevent light source fluctuation in measurement from influencing the measuring results.
Description
technical field [0001] The invention belongs to the technical field of laser applications, in particular to a method for detecting the light-splitting characteristics of a beam splitter of a dual-frequency laser interferometer. Background technique [0002] In the dual-frequency laser interferometer, due to the unsatisfactory polarization state of the laser source, the unsatisfactory performance of the optical components and the inaccurate adjustment of the position of the optical components, there will be two kinds of polarized light with different frequencies in the interference optical path, resulting in frequency mixing. The overlap makes the measured phase change add an additional periodic phase change, resulting in the measured phase change and the measured no longer have a linear relationship, that is, a nonlinear error is generated. The nonlinear error changes with the change of the measured light wavelength as a cycle. In a high-performance laser interferometer, the...
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IPC IPC(8): G01M11/02
Inventor 陆振刚谭久彬梁耀廷方斌
Owner HARBIN INST OF TECH