Multifunctional integrated circuit debugging instrument

A multi-functional, debugger technology, applied in electronic circuit testing, instruments, measuring electricity, etc., can solve the problems of non-specificity, non-concentration of functions, affecting the progress and efficiency of circuit debugging, etc. , the effect of reducing unreliability

Active Publication Date: 2017-01-11
河南捷安新能源科技有限公司
View PDF18 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the variety of these instruments, the functions are not concentrated and not specific
Therefore, a lot of troubles are caused in the use process, which seriously affects the progress and efficiency of circuit debugging.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multifunctional integrated circuit debugging instrument
  • Multifunctional integrated circuit debugging instrument
  • Multifunctional integrated circuit debugging instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] Such as Figure 1-Figure 10 As shown, the multifunctional integrated circuit debugging instrument of the present invention includes a control host 50, a circuit board test fixture 51 and a test signal output observation unit 52; input connection.

[0045] The control host 50 includes a box body 53 in the shape of a cuboid. The box body 53 is provided with a power drive module 54, a switching power supply control module 55, a load control module 56 and a welder constant temperature heating module 57. The rear side of the power drive module 54 is connected to a Stretch out the 220V power line 58 of box body 53 behind, the inner rear part of box body 53 is provided with the radiator 63 that contacts with power drive module 54; Load control module 56 is connected with power drive module 54, and load control module 56 is connected with switch respectively. The power supply control module 55 is connected with the welder constant temperature heating module 57.

[0046] The f...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A multifunctional integrated circuit debugging instrument comprises a control host machine, a circuit board testing clamp and a testing signal output observation unit. The testing signal output end of the circuit board testing clamp is connected with the signal input end of the testing signal output observation unit. The control host machine comprises a cuboid housing which is internally provided with a power driving module, a switching mode power supply control module, a load control module and a welder constant-temperature heating module. The back portion in the housing is provided with a heat radiator which contacts with the power driving module. The load control module is connected with the power driving module. The load control module is connected with the switching mode power supply control module and the welder constant-temperature heating module. The multifunctional integrated circuit debugging instrument has advantages of simple structure and easy operation. Functions of instruments such as an adjustable stabilized power supply, an oscilloscope and an electronic load instrument are integrated. Multiple functions and high integration degree are realized. Furthermore the multifunctional integrated circuit debugging instrument has advantages of easy operation in the use process, reliable connection, high testing accuracy, and great efficiency improvement in performing debugging on the circuit board.

Description

technical field [0001] The invention belongs to the technical field of electronic circuits, in particular to a multifunctional integrated circuit debugging instrument. Background technique [0002] The signal changes and functions of electronic circuits have certain abstract characteristics, and it is difficult to know the working status and characteristics of the circuit through direct observation. Therefore, in the application development and design of electronic products and equipment, a large number of instruments and equipment are needed to build a test environment and obtain circuit status. [0003] Circuit debugging refers to the process of verifying whether the expected performance target is achieved at different stages in the circuit development process, finding the reason for the problems that arise, and repeatedly modifying and verifying the process. [0004] There are many kinds of commonly used circuit debugging instruments, including adjustable regulated power...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2832
Inventor 刘扬孟斌杨留建
Owner 河南捷安新能源科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products