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Measuring method of Vickers hardness of TFT liquid crystal glass substrate

A technology of liquid crystal glass substrate and Vickers hardness, which is applied in the direction of testing material hardness, measuring devices, strength characteristics, etc., can solve problems such as unreachable, achieve the effect of eliminating scratches and improving the yield rate

Inactive Publication Date: 2017-02-01
ZHENGZHOU XUFEI OPTOELECTRONICS TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although the hardness of the glass surface is different under the above different conditions, the difference is quite small. If the traditional hardness tester and its equipped optical microscope are used for detection, due to the magnification and the reflection, transmission and refraction of the glass material to light, etc. , the comprehensive test error (especially the length measurement error of the indentation diagonal line) is greater than the difference in hardness itself, so the experimental purpose cannot be achieved

Method used

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  • Measuring method of Vickers hardness of TFT liquid crystal glass substrate
  • Measuring method of Vickers hardness of TFT liquid crystal glass substrate
  • Measuring method of Vickers hardness of TFT liquid crystal glass substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] The thickness of the TFT liquid crystal glass substrate is 0.3mm, and it is cut into a square glass sheet with a side length of 10mm; the number of measurements in the Vickers hardness tester is 5 times, the measurement load is 200g, and the holding time is 15s; The carbon film spraying time of each indentation in the instrument is 10 minutes; under the magnification of 1500, observe the lengths of the two diagonal lines of each indentation with an electron microscope, and obtain the length values ​​of 5 groups of diagonal lines and calculate The average value of the diagonal length and the Vickers hardness value are shown in Table 1.

Embodiment 2

[0044] The thickness of the TFT liquid crystal glass substrate is 0.7mm, and it is cut into a square glass sheet with a side length of 25mm; the number of measurements in the Vickers hardness tester is 10 times, the measurement load is 200g, and the holding time is 30s; The carbon film spraying time of each indentation in the instrument is 15 minutes; under the magnification of 2000, observe the lengths of the two diagonal lines of each indentation with an electron microscope, and obtain the length values ​​of 10 groups of diagonal lines and calculate The average value of the diagonal length and the Vickers hardness value are shown in Table 2.

Embodiment 3

[0046] The thickness of the TFT liquid crystal glass substrate is 0.5mm, and it is cut into a square glass sheet with a side length of 18mm; the number of measurements in the Vickers hardness tester is 7 times, the measurement load is 200g, and the holding time is 22s; The carbon film spraying time of each indentation in the instrument is 12 minutes; under the magnification of 1700, the lengths of the two diagonal lines of each indentation are observed with an electron microscope, and the length values ​​of 7 sets of diagonal lines are obtained and calculated. The average value of the diagonal length and the Vickers hardness value are shown in Table 3.

[0047] Table 1

[0048]

[0049] Table 2

[0050]

[0051] table 3

[0052]

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Abstract

The invention discloses a measuring method of the Vickers hardness of a TFT liquid crystal glass substrate. The method includes the following steps of a, cutting the TFT liquid crystal glass substrate into square glass sheets with the side length of 10-25 mm; b, measuring the Vickers hardness of the glass sheets obtained in the step a multiple times through a Vickers hardness tester to obtain glass sheets with n indentations on surfaces, wherein n represents the number of measurement times; c, coating the n indentations on the surface of the glass sheets obtained in the step b with conductive film to obtain glass sheets with the surfaces of the indentations covered with the conductive film; d, observing the length of two diagonal lines of each indentation in the n indentations in the glass sheets obtained in the step c through an electron microscope, and calculating the Vickers hardness of the glass substrate according to the lengths of the diagonal lines. By means of the method, the Vickers hardness of the liquid crystal glass substrate can be accurately measured.

Description

technical field [0001] The disclosure relates to the field of glass parameter measurement, in particular to a method for measuring the Vickers hardness of a TFT liquid crystal glass substrate. Background technique [0002] The current flat panel display technology has been widely promoted and applied, especially the TFT-LCD liquid crystal display technology occupies a dominant position in the current display field. As the main component of the TFT-LCD display, the performance of the liquid crystal glass substrate directly affects the quality of the display panel. , especially important is that it will seriously affect the yield rate of the glass substrate in the panel production process, and directly affect the overall cost of the display panel. Since the smallest display unit size in TFT display technology is about tens to hundreds of microns, a very small scratch on the surface of the glass substrate will cause the product to be discarded during the coating process, reduce...

Claims

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Application Information

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IPC IPC(8): G01N3/40G02F1/13
CPCG01N3/40G01N2203/0005G01N2203/0076G02F1/1309
Inventor 刘文渊李福庆杨忠杰付冬伟张丹闫雪锋
Owner ZHENGZHOU XUFEI OPTOELECTRONICS TECH
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