An extracting method and system for electromagnetic radiation characteristic parameters of apparatuses
A technology of electromagnetic radiation and characteristic parameters, applied in electrical digital data processing, special data processing applications, electrical measurement, etc., can solve the problems of high computing memory pressure, long simulation time, complex analysis and extraction process, etc., to improve the acquisition speed , the effect of simplification of simulation model, reduction of simulation time and pressure on computing memory
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0033] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.
[0034] Electromagnetic interference is divided into conducted interference and radiated interference. Conducted interference refers to the coupling of a signal on one electrical network to another electrical network through a conductive medium. Radiated interference refers to the interference source coupling its signal to another electrical network through space. The embodiments of the present invention mainly analyze ra...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com