Method of testing driving circuit

A technology for driving circuits and sensing voltages, applied in instruments, static indicators, etc., can solve the problems of poor products, high production costs, and difficult driving circuit processes, and achieve the effect of reducing production costs.

Active Publication Date: 2017-02-15
BOE TECH GRP CO LTD
View PDF7 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The process of generating the driving circuit is quite difficult, which sometimes causes abnormalities in the generated driving circuit. On the basis of the a

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method of testing driving circuit
  • Method of testing driving circuit
  • Method of testing driving circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] An embodiment of the present invention provides a driving circuit, the driving circuit is located on an array substrate, and the array substrate further includes a pixel unit corresponding to the driving circuit, and the driving circuit is used to drive the corresponding pixel unit to emit light. see Picture 1-1 , the drive circuit includes:

[0039] The first transistor T1, the second transistor T2, the third transistor T3, the pixel storage capacitor Cst, the first parasitic capacitor Cg1 and the second parasitic capacitor Cg2;

[0040] The gate of the first transistor T1 is connected to the gate scanning input terminal G1, the first pole is connected to the data input terminal Data, the second pole is connected to the gate of the second transistor T2, the first metal layer of the pixel storage capacitor Cst and the first The first end of the parasitic capacitor Cg1 is connected;

[0041] The first pole of the second transistor T2 is connected to the power supply te...

Embodiment 2

[0050] An embodiment of the present invention provides a method for detecting a driving circuit, and the method is used for detecting the driving circuit provided in Embodiment 1.

[0051] see diagram 2-1 As shown in the timing signal diagram, the present invention provides data signal Data, gate line scanning signal GS1, voltage signal V, first control signal Sen and second control signal GS2; , the gate scan signal GS1 , the voltage signal V, the first control signal S and the second control signal GS2 detect the driving circuit.

[0052] see Figure 2-2 , the method flow for detecting the drive circuit includes:

[0053] Step 201: Input the data signal Data, the gate line scanning signal GS1, the voltage signal V and the first level of the first level to the data input terminal Data, the gate scanning input terminal G1, the power supply terminal Vdd and the sensing voltage terminal Sen respectively of the driving circuit. a control signal S.

[0054] see diagram 2-1 , ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method of testing a driving circuit, and belongs to the field of display. The method comprises the following steps: inputting a data signal, a gate line scanning signal, a voltage signal, and a first control signal of a first level to a data input end, a gate scanning input end, a power end and a sensing voltage end of a driving circuit respectively; making a pixel storage capacitor perform charging by inputting a second control signal of a second level to a sensing scanning input end of the driving circuit, and measuring a first voltage at the anode end of an organic light emitting diode OLED of the driving circuit; making the pixel storage capacitor perform discharging by inputting a third control signal of a third level to the sensing scanning input end of the driving circuit, and measuring a second voltage at the anode end of the OLED of the driving circuit; and determining whether the driving circuit is abnormal according to the first voltage and the second voltage. The cost of production can be reduced.

Description

technical field [0001] The invention relates to the display field, in particular to a method for detecting a driving circuit. Background technique [0002] An AMOLED (Active-matrix organic light emitting diode, active matrix organic light emitting diode) screen includes components such as an array substrate. The array substrate includes a plurality of pixel units, and each pixel unit corresponds to a driving circuit. The driving circuit is used to drive its corresponding pixel unit to emit light. [0003] When producing the array substrate, the driving circuit can be generated on the glass substrate through a patterning process, and the pixel unit corresponding to the driving circuit and other parts of the array substrate can be generated on the glass substrate through the patterning process, and the other parts can be It is the filter layer, black matrix and other components. [0004] In the process of realizing the present invention, the inventor finds that there are at...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G09G3/00
CPCG09G3/006G09G2310/0267G09G2330/12G09G3/3233G09G3/3266G09G2320/043
Inventor 李永谦徐攀袁志东
Owner BOE TECH GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap