Method for identifying a short circuit in a first light emitting diode element, and optoelectronic subassembly

A technology of light-emitting diodes and optoelectronics, applied in diode testing, electroluminescent light sources, short-circuit testing, etc., can solve problems such as high current density, electrode melting, heating, etc., and achieve the effect of simply identifying short-circuits
CN106574944AActive Publication Date: 2017-04-19OSRAM OLED
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
OSRAM OLED
Publication Date
2017-04-19

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Abstract

Various exemplary embodiments relate to a method for identifying a short circuit in a first light emitting diode element (50). In said method, the first light emitting diode element (50) is operated in the reverse mode. Verification is made as to whether an electric current (IR) flows in the reverse direction across the light emitting diode element (50), and the short circuit is identified if said verification indicates that the current (IR) flows in the reverse direction and is greater than a given leakage current.
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Description

technical field

[0001] The invention relates to a method for detecting a short circuit in a first light-emitting diode element and to an optoelectronic component. Background technique

[0002] The light-emitting optoelectronic component can be, for example, a light-emitting diode (LED) or an organic light-emitting diode (OLED). OLEDs can have an anode and a cathode, the cathode having an organic functional layer system between the anode and the cathode. The organic functional layer system can have: one or more emitter layers, in which electromagnetic radiation is generated; a charge carrier pair generating layer structure, which is respectively composed of Two or more carrier pair generating layers ("charge generating layers", CGLs) for generating carrier pairs; and one or more electron blocking layers, also known as hole a "hole transport layer" (HTL); and one or more hole-blocking layers, also known as "electron transport layers" (ETL), in order to rectify (richten) the ...

Claims

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