Device characteristic aging adaptive control method and device

A technology of self-adaptive control and characteristics, applied in electrical components, pulse technology, logic circuits, etc., can solve problems such as circuit performance degradation, and achieve the effect of extending working life and solving circuit performance degradation.
CN106656162BActive Publication Date: 2019-12-10INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
Publication Date
2019-12-10

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Abstract

The invention provides a self-adaptive control method for characteristic aging of a device. The method comprises that a representative value of the present characteristic aging state of the device of an integrated circuit is obtained in real time; a calibration control signal value is determined according to the representative value of the characteristic aging state of the device; and the calibration control signal value is used to control a calibrated power voltage output by a voltage regulator, and the calibrated power voltage serves as a present working voltage of the integrated circuit. The problem that aging of an MOSFET device causes performance degeneration of the circuit is solved effectively, and the service life of an integrated circuit chip is prolonged.
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Description

technical field

[0001] The invention relates to the field of circuit design, in particular to a device aging characteristic self-adaptive control method and device. Background technique

[0002] During the long-term working process of MOS integrated circuits, MOSFET device hot carrier injection (HCI), substrate positive bias instability (PBTI), and negative bias instability (NBTI) will obviously lead to the drift of MOSFET threshold voltage. It further causes the change of the current-voltage curve, which is manifested as the change of the charge and discharge current on the circuit, and the circuit performance is degraded under the same working voltage. Therefore, effects such as HCI, PBTI, and NBTI will cause device characteristics to deviate from the normal operating range and shorten the working life of integrated circuit chips. Such a process is called device characteristic aging. With the development of manufacturing processing technology, the feature size has been co...

Claims

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