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Insertion type near infrared probe and work method thereof

A working method, near-infrared technology, applied in the field of near-infrared analysis, can solve problems such as time-consuming and laborious uncertain factors, poor sampling operability of the sampler, and reduced accuracy of detection results, so as to improve detection accuracy, improve accuracy and Reliability, the effect of reducing requirements

Inactive Publication Date: 2017-05-31
FOCUSED PHOTONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] 1. It is necessary to manually sample each sampling object in turn, and the sampler has poor sampling operability and cumbersome work;
[0004] 2. After the sample is taken out and before the test, the sample is placed in the sample tray, and the ambient temperature and air humidity will affect the test results of the sample, resulting in low test accuracy and poor repeatability;
[0005] 3. Sampling and testing are carried out step by step with different instruments, which is time-consuming and laborious and increases uncertain factors, which reduces the accuracy of test results

Method used

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  • Insertion type near infrared probe and work method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] figure 1 Schematically provides a simplified structural diagram of the cutting-type near-infrared probe of this embodiment connected to the near-infrared analyzer, as shown in figure 1 As shown, the near-infrared probe includes:

[0043] Spike part 1, said spike part is located at the head of said near-infrared probe, and is used for inserting the sample to be tested;

[0044] Calibration system 2, the calibration system includes a standard light source and a temperature and humidity sensor, located at the rear end of the spike;

[0045] Insertion rod 3, described insertion rod connects described calibration system and hand-held part;

[0046] Hand-held part 4, described hand-held part is connected with optical fiber assembly, and near-infrared probe can carry out signal transmission with near-infrared analyzer 7 through described optical fiber assembly; Described optical fiber assembly includes optical fiber 61 and optical fiber connector 62;

[0047] A switching mo...

Embodiment 2

[0064] An application example of the cutting-type near-infrared probe and its working method in Example 1 of the present invention in the field of grain quality monitoring.

[0065]In this application example, the sample to be tested is bagged grain (such as corn, wheat, etc.), and the spiked part is a sharp steel pipe with an opening at the head, which can be easily inserted into the grain bag; the insertion rod is made of sanitary stainless steel The steel pipe can be inserted into the grain, and the length of the insertion rod can be designed according to the needs to expand the range of grain detection points; the hand-held part is a pistol-shaped handle to improve the comfort of holding, of course, different shapes of the hand-held part can also be selected; the switching module is The button set on the hand-held part is convenient for control. The button can be one or two. In this application example, there is one button, and the calibration mode and the detection mode ar...

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Abstract

The invention relates to an insertion type near infrared probe, which comprises a spine part, a calibration system, an insertion rod, a handheld part and a switching module, wherein the spine part is positioned at the head part of the near infrared probe and is used for inserting a sample to be tested; the calibration system comprises a standard light source and a temperature and humidity sensor, and is positioned at the back end of the spine part; the insertion rod is connected with the calibration system and the handheld part; the handheld part is connected with an optical fiber assembly; the near infrared probe performs signal transmission with a near infrared analyzer through the optical fiber assembly; the switching module controls the near infrared probe to be switched between the calibration mode and the detection mode. The invention also provides a work method of the near infrared probe. The insertion type near infrared probe has the advantages that the operation is simple; the efficiency is high; the measuring result is accurate, and the like.

Description

technical field [0001] The invention relates to the field of near-infrared analysis, in particular to a near-infrared analyzer with a cutting probe and a working method thereof. Background technique [0002] In the process of grain storage or transportation, in order to grasp and monitor the quality of grain, it is necessary to analyze and test the grain that has been stacked in bags. The existing solution is to use a manual sampler to sample the sample to be tested, collect a certain number of samples, and use a near-infrared analyzer for analysis and detection. However, this detection method has the following defects: [0003] 1. It is necessary to manually sample each sampling object in turn, and the sampler has poor sampling operability and cumbersome work; [0004] 2. After the sample is taken out and before the test, the sample is placed in the sample tray, and the ambient temperature and air humidity will affect the test results of the sample, resulting in low test ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3563G01N21/01
CPCG01N21/01G01N21/3563
Inventor 吴键波慎石磊胡建坤沈超郭中原杨伟伟李小明
Owner FOCUSED PHOTONICS
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