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Analog source testing system of rotation base-line interferometer positioning system and application method of analog source testing system

A technology of positioning system and test system, which is used in radio wave measurement systems, positioning, instruments, etc.

Active Publication Date: 2017-05-31
SHANGHAI ENG CENT FOR MICROSATELLITES
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Problems solved by technology

In order to realize the above-mentioned line-feed test, it is necessary to simulate the air-feed signal received under the condition of baseline rotation. The simulation of this signal must be synchronized with the baseline rotation angle, positioning system position and attitude received by the interferometer in real time. There is currently no solution for the above-mentioned rotation. Radiation Source Simulation System of Baseline Interferometer Positioning System

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  • Analog source testing system of rotation base-line interferometer positioning system and application method of analog source testing system

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Embodiment Construction

[0017] The specific implementation manners provided by the present invention will be described in detail below in conjunction with the accompanying drawings.

[0018] Such as figure 1 As shown, the embodiment of the present invention provides an analog source test system for a rotating baseline interferometer positioning system, including: a radiation source signal generation module, a signal sampling data generation module, a large-capacity storage module, and a radio frequency module B; the radiation source signal generation module According to the set data duration and signal characteristics, the empty-feed pulse description word data is generated, and the empty-feed pulse description word data includes: the carrier frequency of each pulse, relative arrival time, intra-pulse modulation mode, pulse width, bandwidth and the pulse The position of the radiation source; and output to the signal sampling data generation module, generate the empty feed signal and send it to the ma...

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Abstract

The invention provides an analog source testing system of a rotation base-line interferometer positioning system and an application method of the analog source testing system. The analog source testing system comprises a radiation source generating module, a signal sampling data generating module, a high-capacity storage module and a radio frequency module B, wherein the radiation source generating module generates space-fed pulse description word data according to set data duration and signal features and outputs the space-fed pulse description word data to the signal sampling data generating module, and the signal sampling data generating module generates a space-fed signal and transmits the space-fed signal to the high-capacity storage module; the radio frequency module B reads the space-fed signal to generate a radio frequency signal and transmits the radio frequency signal into the detecting antenna of the positioning system through an antenna in a space-fed manner. By the analog source testing system, the wireless space-fed positioning testing signal can be simulated.

Description

technical field [0001] The invention relates to a simulation source test system of a positioning system, in particular to a simulation source test system of a rotating baseline interferometer positioning system and a method for using the same. Background technique [0002] The positioning system based on the rotating baseline interferometer measures the phase difference of the radiation source signal received at different rotation angles through a single baseline under the condition of rotation, and combines the position and attitude of the positioning system to realize the defuzzification positioning capability of the radiation source in the full field of view. [0003] The particularity of the positioning system of the rotating interferometer requires that the performance of the positioning system and the test of some functions can only be carried out under the condition of the rotating table. However, in the development process of the positioning system, most of the test ...

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Application Information

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IPC IPC(8): G01S5/06
CPCG01S5/021G01S5/06
Inventor 梁广孙思月朱华常凯潘超姜兴龙马菁涛
Owner SHANGHAI ENG CENT FOR MICROSATELLITES
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