LCM (LCD Module) assembly appearance defect detection method based on 3D imaging technology

Abstract

The invention relates to an LCM (LCD Module) assembly appearance defect detection method based on a 3D imaging technology and belongs to the field of LCM assembly appearance defect detection. The LCM assembly appearance defect detection efficiency and precision can be improved. According to the method, an original height image of an LCM assembly is obtained through a 3D laser sensor; the image comprises a background area indicating an environment background, a cover area indicating a peripheral circuit cover part, and a screen area indicating a screen part; the original height image is converted into a first height image indicating a true height value of the LCM assembly according to a position relationship between the 3D laser sensor and the LCM assembly; the background area is filtered through utilization of the range difference of the height values of the background area and the cover area and the screen area, thereby obtaining a second height image; and whether a defect exists in the appearance of the LCM assembly or not is judged according to the height values of the cover and the screen area in the second height image. The method is used for carrying out LCM assembly appearance defect detection precisely and efficiently instead of manpower.

Description

Technical field [0001] The invention relates to the field of LCM component shape defect detection, in particular to the field of LCM component shape defect detection based on 3D imaging technology. Background technique [0002] In the current production process of LCM (LCD Module, liquid crystal display module) components, the defects in the shape of the LCM component can be distinguished by the height relationship between the Cover (cover) area of ​​the peripheral circuit in the LCM component and the shape of the screen area. The prior art The detection of the height relationship between the Cover area and the screen area in the LCM component is based on the visual method, that is, the binocular recognition method. The inspector observes the height of the Cover area and the screen area of ​​the LCM component through both eyes, and makes two observations. The judgment of the height difference. The inspectors are generally young people with good eyesight between the ages of 18-24...

AI Technical Summary

Problems solved by technology

The inspectors are generally young people with good eyesight between the ages of 18 and 24. Using the visual inspection method has a strong personal subjective initiative, and the inspectors work too long, which will cause eye fatigue and make the test results inaccurate. accurate

In addition, a large number of inspectors are required on the production line, which is costly and relatively low in efficiency and accuracy

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