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Image event detection marking method and system

An event detection and image technology, applied in image communication, TV system components, electrical components, etc., can solve the problems of increasing the cost of imaging system implementation, wasting storage capacity and extra transmission bandwidth, etc., so as to facilitate hardware transplantation and reduce data Effect of transmission bandwidth and storage capacity, high data processing capability

Active Publication Date: 2017-05-31
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Claims
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Problems solved by technology

At the same time, redundant data (such as background data) in the image data is not concerned by analysts, but a large amount of storage capacity and additional transmission bandwidth are wasted, which greatly increases the implementation cost of the imaging system.

Method used

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  • Image event detection marking method and system
  • Image event detection marking method and system

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Embodiment Construction

[0019] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0020] figure 1 It is a block diagram of an image event detection and marking system according to an embodiment of the present invention.

[0021] like figure 1 As shown, the system includes a state register unit, a data distributor, an S-O-F inserter, an event detection unit, and a code stream synthesizer.

[0022] According to an embodiment of the present invention, the state register unit includes: P (Pixel, pixel) loop counter, L (Line, row) loop counter, F (Frame, frame) increment counter, and threshold value register, its input terminal and image data source It is connected to the setting input, and its output is connected to the data distributor, event detection unit, S-O-F (frame header) inserter and code stream...

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PUM

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Abstract

The invention discloses an image event detection marking method. The method is used for outputting image event detection data after processing an original image data flow, and comprises the following steps of: obtaining the first frame of image data in the original image data flow; executing the following operations sequentially for each frame of image data after the first frame of image data: replacing dark pixel row data of the frame image by a system alignment code; calculating the residual error among all pixel points of effective pixel rows of the frame image and the corresponding pixel rows of the previous-frame image; according to the range which the residual error belongs to, outputting event detection data of all the pixel points in the current pixel row till all the effective pixel rows of the current frame are processed; and, after all image data of the original image data flow is processed, outputting the first frame of original image data, the system alignment code of other frame images and the event detection data.

Description

technical field [0001] The invention relates to the technical field of image information processing, in particular to an image event detection and marking method and system. Background technique [0002] Image sensors have been widely used in various fields such as scientific research, industrial production, medical and health care, and national defense and military affairs. With the continuous improvement of image resolution and image frame rate, humans can observe more subtle object features or more transient physical phenomena, which greatly enriches human observation methods and improves human cognition. [0003] However, with the rapid improvement of image performance parameters, it also brings a huge challenge that the amount of image data and data transmission bandwidth increase exponentially. Massive image data and ultra-high data transmission bandwidth have brought a series of technical challenges to subsequent transmission, storage, and processing. [0004] At pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/14H04N5/217
CPCH04N5/147H04N25/63
Inventor 秦琦王加庆吴南健
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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