Cluster-type automatic test method

Abstract

The invention relates to a cluster-type automatic test method and belongs to the technical field of storage. A console is used for automatically configuring the password-free login between a client and a storage device, distributing a test configuration file and a parameter file and automatically completing the configuration work for the storage device and the node; the automatic configuration time is synchronous; a control terminal is used for automatically detecting the current test environment; when the environment does not meet a test condition, the control terminal can prompt the corresponding information; a tester can update the environment according to the information; when the environment meets the test condition, the console can automatically distribute and use the test file for testing the storage device and can monitor the system load, service and process in real time; after the test is normally completed, the console can collect all the related test data of the clients and the storage device and can analyze. Compared with the prior art, the cluster-type automatic test method has the advantages that a large amount of labor cost is saved, the time for configuring the test environment is shortened, so that the test efficiency is greatly increased, and the repeated configuration work and the test process are automatic so that the accuracy of the configuration and the test result is increased.

Description

technical field [0001] The invention relates to a cluster type automatic testing method, which is suitable for storage devices of any business and belongs to the technical field of computer storage. Background technique [0002] With the advent of the big data era, the application of storage devices is becoming more and more extensive, and the requirements for the stability and reliability of storage devices are becoming more and more stringent. There is an urgent need for a general framework for verifying the stability and reliability of storage devices. [0003] Multi-node testing has always been an important method to verify the stability and reliability of storage devices. When the scale of nodes reaches hundreds or thousands, manual configuration has become the bottleneck of testing, which consumes a lot of time and labor costs, and the configuration process is extremely error-prone. In many cases, multi-node coordinated operation is required, and it is difficult for m...

AI Technical Summary

Problems solved by technology

When the scale of nodes reaches hundreds or even thousands, manual configuration has become the bottleneck of testing, which consumes a lot of time and labor costs, and the configuration process is extremely error-prone

In many cases, multi-node coordinated operation is required, and manual operation is difficult to grasp the correct time point

Due to the large number of nodes, it is almost impossible to complete the work only by manually monitoring the workload and resource usage of the system

The final test results are also extremely difficult to collect, and if there is an abnormal situation during the test, it is impossible to track and analyze

This will inevitably lead to insufficient testing of storage devices in terms of stability and reliability, and factors that may cause system failures cannot be found in time

[0004] To sum up, manually configuring multi-node testing is time-consuming, laborious, and inefficient. It is difficult to perform multi-node collaborative operations, effectively monitor workloads and resource usage, and it is extremely difficult to collect test results. Storage devices leave hidden dangers

Images