Light source arrangement method for RFID (radio frequency identification) tag automatic optical detection

Abstract

The invention relates to a light source arrangement method for RFID (radio frequency identification) tag automatic optical detection. The method comprises a machine frame, wherein the machine frame is provided with an unreeling roll, a reeling roll, a visual detection device, a plurality of delivery wheels, a display device and an ink-jet printer, wherein one end of an RFID tag tape formed by bonding a plurality of RFID tags to a release paper tape is wound on the unreeling roll, and the other end penetrates through the visual detection device sequentially via the delivery wheels and is wound on the reeling roll; the visual detection device comprises a first detection device and a second detection device which are arranged horizontally at an interval; the first detection device comprises a front camera, a first left reflected light source, a first right reflected light source and a first transmitted light source; the second detection device comprises a back camera, a second left reflected light source, a second right reflected light source and a second transmitted light source; and the front camera and back camera are respectively connected with the display device through signal wires. The method is advanced and scientific; and the detection combination of the front and back sets and the visual solution of reflected light-transmitted light composite mode are utilized to effectively detect various types of defects in various materials.

Description

technical field [0001] The invention relates to a light source configuration method for automatic optical detection of RFID tags, belonging to the technical field of RFID tag detection. Background technique [0002] Automated Optical Inspection (AOI) is a new type of testing technology that is emerging. It is a device based on optical principles to detect common defects encountered in production. AOI uses a wealth of dedicated multi-functional detection algorithms and binary or gray-level optical imaging processing technology for detection. By using AOI as a tool for detecting defects, it can reduce manpower requirements, reduce dependence on personnel and improve inspection consistency. At present, there is no roll-to-roll RFID label testing equipment. The light source configuration of the existing optical testing equipment cannot detect the dirt inside the INLAY and the bottom paper surface. The testing items are not perfect, so it is difficult to meet the needs of mass p...

AI Technical Summary

Problems solved by technology

At present, there is no roll-to-roll RFID label testing equipment. The light source configuration of the existing optical testing equipment cannot detect the dirt inside the INLAY and the bottom paper surface. The testing items are not perfect, so it is difficult to meet the inspection needs of mass production.

Images