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Automatic correction method for in-band flatness of oscilloscope

An oscilloscope and flatness technology, applied in instruments, digital variable display, digital variable/waveform display, etc., can solve problems such as difficulty in adjusting bandwidth flatness, reduce production and debugging costs, avoid complexity, and improve flexibility. Effect

Active Publication Date: 2017-06-27
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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Problems solved by technology

However, when the bandwidth of the oscilloscope is increased to tens of GHz, and the circuit distribution parameters have a great influence on the amplitude-frequency characteristic curve within the bandwidth, the traditional method of adjusting the bandwidth flatness by relying on analog devices is difficult to achieve

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  • Automatic correction method for in-band flatness of oscilloscope
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  • Automatic correction method for in-band flatness of oscilloscope

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Embodiment Construction

[0013] In order to further illustrate the technical means and effects of the present invention to achieve the predetermined purpose, the present invention will be described in detail below with reference to the accompanying drawings and preferred embodiments.

[0014] The automatic correction method for in-band flatness of the oscilloscope provided by the present invention can improve the flexibility of bandwidth flatness adjustment of the broadband oscilloscope. The automatic correction method of the in-band flatness of the oscilloscope of the present invention and its respective steps will be described in detail below.

[0015] Such as figure 1 As shown, the automatic correction method of the in-band flatness of the oscilloscope of this embodiment includes: Step S10: According to the bandwidth Fend of the oscilloscope, determine the number of parts M+1 that the bandwidth interval [0, Fend] is uniformly discretized and the correction bandwidth Fend The order of the filter used is N...

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Abstract

The invention proposes an automatic correction method for an in-band flatness of an oscilloscope, and the method comprises the steps: determining the number M+1 of parts into which a bandwidth section [0, Fend] is uniformly discretized and the number of orders of a filter which is used for correcting bandwidth; forming an initial array F={0, Fend / M, 2*Fend / M,..., (M-1)*Fend / M, M*Fend / M}, and recording the amplitude values of frequency points corresponding to M+1 elements in the initial array F at the same time; selecting a reference point from the frequency points, recording the amplitude value of the reference point as Vbase, taking the logarithm 20*lg(Vfm / Vbase) of the amplitude values of M+1 frequency points relative to the amplitude value of the reference point, calculating the gain values of the frequency points relative to the reference point, and forming a new array Y; Carrying out the call of a function gremez(N-1, F, Y, w) in matlab, and generating a filter coefficient h; and achieving a linear phase finite impulse response filter in an FPGA.

Description

Technical field [0001] The present invention relates to the technical field of oscilloscopes, and in particular to an automatic correction method for the flatness in the oscilloscope band. Background technique [0002] The complexity of modern electronic signals, especially the bandwidth and non-stationary characteristics, has grown extremely rapidly. The frequency domain test instrument based on sweep frequency is difficult to meet the real-time test requirements of broadband and transient signals from the measurement principle. The real-time sampling time domain instrument is becoming the mainstream development trend of modern electronic testing technology. At present, the bandwidth of the input signal of the oscilloscope is mainly guaranteed by the device. The bandwidth of the front-end analog signal conditioning circuit and ADC must be higher than the bandwidth value designed by the instrument, and many adjustable parameters are reserved to ensure the flat amplitude-frequency...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/02
CPCG01R13/02G01R13/029
Inventor 胡志臣刘家玮林桐储艳莉黄月芳
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH