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Test method for transient common mode inhibition parameter of digital isolation type device

A technology of digital isolation and common mode suppression, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems affecting the performance and reliability of electronic components in the equipment, and achieve the effect of cost saving and simple operation

Inactive Publication Date: 2017-06-27
BEIHANG UNIV
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  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0018] (5) Equipment power supply on-off cycle: long-term storage and dormant equipment often need to be periodically powered on and tested, which will affect the performance and reliability of electronic components in the equipment

Method used

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  • Test method for transient common mode inhibition parameter of digital isolation type device
  • Test method for transient common mode inhibition parameter of digital isolation type device
  • Test method for transient common mode inhibition parameter of digital isolation type device

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Embodiment Construction

[0071] The test method described in the present invention takes HCPL-2611 as an example for testing. The selected high-voltage pulse source is AVTECH's AVRQ-4-B, the device under test is HCPL-2611 high-speed photocoupler, the oscilloscope uses MDO3022, and it is connected to the computer through the GPIB line.

[0072] The present invention is a method for testing transient common mode suppression parameters of digital isolation devices, such as Figure 8 As shown, the specific implementation steps are as follows:

[0073] Step 1: Select the digital isolation device HCPL-2611, and record the truth table in the device manual and the input current range information for both input low and input high conditions. Based on |CM H |and|CM L The definition of |, first get V CM And the corresponding dt.

[0074] Step 2: Digital isolation device CMTI test circuit design and configuration. Design test circuit such as figure 2 . The HCPL-2611 product manual shows I Fmin =6.5mA, I Fmax = 15...

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Abstract

The invention relates to a test method for a transient common mode inhibition parameter of a digital isolation type device. The test method comprises steps that 1, a digital isolation device is selected, and a truth table of a device manual and the input current scope information under lower input and high input conditions are checked; 2, a digital isolation device CMTI test circuit is designed and configured; 3, the digital isolation device CMTI is tested; and 4, a test result of the digital isolation device CMTI is analyzed. Through the method, the transient common mode inhibition parameter of a target device is tested, pulses are utilized to provide input and output interference, through adjusting a pulse parameter, interference waveform is acquired, and the waveform data is further evaluated, the common mode inhibition test and evaluation effects of the digital isolation device are realized, and an actual problem that transient common mode inhibition of a high speed optoelectronic coupler in engineering can not be accurately evaluated is solved.

Description

Technical field [0001] The invention relates to a method for testing transient common mode suppression parameters of digital isolation devices. It is mainly a method of testing and evaluating the suppression ability of the device against common-mode transient performance to prevent the device from malfunctioning due to the degradation of transient operating characteristics in response to actual engineering requirements such as high-speed data transmission of digital isolation devices. Improve the working reliability of the device. It belongs to the field of performance testing of electronic components. Background technique [0002] Digital isolation devices have the advantages of high transmission rate, good signal fidelity, low cost, high efficiency and integration, so they are widely used in electronic systems with relatively high requirements for long life and stable performance, especially in some applications The environment is relatively harsh, in order to isolate the inp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 高会壮王香芬黄姣英
Owner BEIHANG UNIV
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