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Three-dimensional shape measurement device, three-dimensional shape measurement system and method

A technology of three-dimensional shape and measuring device, which is applied in the direction of measuring device, three-dimensional system, optical device, etc., and can solve problems such as complex structure and inability to realize easily

Inactive Publication Date: 2017-07-07
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, in the prior art exemplified in the aforementioned Patent Document 1, in order to obtain the position of the light cut-off line formed on the surface of the object to be measured by the linear light, an external position measuring device such as an encoder or a precise precision device such as a robot are required. Moving mechanism, therefore, there is a problem that the structure becomes complicated and cannot be easily realized

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  • Three-dimensional shape measurement device, three-dimensional shape measurement system and method
  • Three-dimensional shape measurement device, three-dimensional shape measurement system and method
  • Three-dimensional shape measurement device, three-dimensional shape measurement system and method

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Embodiment approach 1

[0067] In the following, before describing the three-dimensional shape measuring system 1 according to one aspect of the present invention, in order to facilitate the understanding of the three-dimensional shape measuring system 1, first based on Figure 9 ~ Figure 11 A conventional three-dimensional shape measuring system 2 will be described.

[0068] (Outline of existing 3D shape measurement systems)

[0069] Figure 9 It is a diagram showing an outline of a conventional three-dimensional shape measuring system 2 . Such as Figure 9 As shown, the existing three-dimensional shape measuring system 2 includes an encoder 500 , a conveyor 600 , a light projecting unit 700 , a light receiving unit 800 and an existing three-dimensional shape measuring device 900 .

[0070] The light projecting unit 700 irradiates the surface of the object 70 placed on the stage with the line laser 60 (line light), and the light receiving unit 800 captures the object 70 irradiated by the line laser...

Embodiment approach 2

[0208] The control blocks of the three-dimensional shape measuring device 10 (in particular, the irradiation control unit 101, the image capture control unit 102, the image separation unit 103, the marker search unit 104, the marker storage unit 105, the distance contour extraction unit 106, the contour position correction unit 107, The mapping correction unit 108, the distance image memory interpolation unit 109, the inspection and measurement unit 110, the imaging unit 111, and the display control unit 112) can be realized by a logic circuit (hardware) formed in an integrated circuit (IC chip) or the like, or can be implemented using The CPU (Central Processing Unit) is realized by software.

[0209] In the latter case, the three-dimensional shape measuring apparatus 10 is equipped with a CPU for executing commands of software, that is, a program for realizing each function, and a ROM (Read Only Memory) for storing the above-mentioned program and various data in a computer (o...

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Abstract

The 3D shape of a measurement object is measured accurately without using an encoder or other devices. A three-dimensional shape measurement device (10) includes a mark search unit (104) that calculates, using a search mark (40), a coordinate of a part of a surface of a measurement object (70) including an optical cutting line formed with line laser light (60).

Description

technical field [0001] The present invention relates to a three-dimensional shape measuring device that analyzes a plurality of images including light cut-off lines formed on the surface of an object to be measured by linear light, and measures the three-dimensional shape of the object to be measured. Background technique [0002] As a method of obtaining three-dimensional shape information of an object to be measured by image analysis, there is known a light section method using the principle of triangulation, and the like. For example, the following Patent Document 1 discloses a three-dimensional shape measuring device that relatively scans an object and patterned light, and acquires a plurality of images while changing parameters that affect the brightness of the image. Including the pattern appearing on the surface of the object, the three-dimensional shape of the object is obtained using the luminance information of the pattern whose luminance level of each pixel in the...

Claims

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Application Information

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IPC IPC(8): G01B11/25H04N13/221
CPCG01B11/254G01B11/2522H04N13/221G06T7/97G06T7/579H04N13/254H04N13/271G06T2207/30204
Inventor 饭田丰男
Owner ORMON CORP