Scanning Laue diffraction spectrum analysis method based on peak-to-peak included angle comparison

A scanning and Laue technology, applied in the field of characterization of crystal microstructure, can solve problems such as limited applications, and achieve the effect of consuming less computer resources, less time, and less calculation

Active Publication Date: 2017-07-14
XI AN JIAOTONG UNIV
View PDF5 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this disadvantage severely...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Scanning Laue diffraction spectrum analysis method based on peak-to-peak included angle comparison
  • Scanning Laue diffraction spectrum analysis method based on peak-to-peak included angle comparison
  • Scanning Laue diffraction spectrum analysis method based on peak-to-peak included angle comparison

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and understandable, the following combination figure 2 The illustrated embodiment samples describe in detail the specific implementation method of the present invention.

[0054] figure 2 The example sample shown is 304 stainless steel, in figure 2 The crystal orientation information of each point in the sample can be seen in , and the distribution of grain boundaries can be clearly seen.

[0055] Such as figure 1 As shown, the scanning Laue diffraction pattern analysis method based on the angle between peaks in this embodiment includes the following steps:

[0056] Step 1: Using a known method, perform a peak-finding operation on all the Laue diffraction patterns obtained from the scanning Laue diffraction experiment, and obtain the positions and integral intensities of all diffraction peaks on each Laue diffraction pattern.

[0057] Step 2: Calculate the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a scanning Laue diffraction spectrum analysis method based on peak-to-peak included angle comparison. The analysis method includes the steps of: 1) performing peak searching operation to all obtained diffraction spectrums in experiment to acquire position and integral intensity of a diffraction peak; 2) defining a method for calculating standard peak angle differential sequence D<S, i> of an indexation point; 3) defining a method of comparing whether two points belong to the same crystalline grain or not; 4) selecting a traversal method to traverse all points in an experimental zone, thus completing the calibration of peaks of the diffraction spectrums corresponding to all points in the experimental zone and acquiring crystal/phase boundary distribution in the experimental zone. The method has low calculation load and is short in time consumption.

Description

technical field [0001] The present invention relates to the technical field of characterization methods for crystal microstructures, in particular to an analysis of scanning Laue diffraction patterns, in which the diffraction peaks in the scanning Laue diffraction patterns are calibrated and at the same time the crystals / crystals in the scanning area of ​​scanning Laue diffraction experiments are obtained. Method for Phase Boundary Segmentation Information. Background technique [0002] The microstructure of materials has a significant impact on the mechanical properties of materials, thus affecting the service use of materials. Therefore, it is of great significance to characterize the microstructure of materials to study the mechanical behavior and failure mechanism of materials, so as to improve the material processing technology of related materials. The commonly used characterization methods for the microstructure of materials include optical microscope, scanning elect...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N23/207
CPCG01N23/207G01N2223/0566G01N2223/604
Inventor 陈凯寇嘉伟朱文欣
Owner XI AN JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap