Transient pulse width stretching circuit and method

Abstract

The invention relates to a transient pulse width broadening circuit and method. The circuit comprises a plurality of broadening units connected in series, wherein each broadening unit comprises a first inverter circuit and a second inverter circuit, an input end of the first inverter circuit is connected with the input end of the broadening unit, an output end of the first inverter circuit is connected with the input end of the second inverter circuit, and the output end of the second inverter circuit is connected with the output end of the broadening unit; an transient pulse signal is input to the transient pulse width broadening circuit and passes the broadening units in sequence, the first inverter circuits and the second inverter circuits of the broadening units respectively output pulses inverted with the input pulse signal, and the rise time / fall time of the output pulse of the second inverter circuit is greater than the fall time / rise time of the output pulse of the first inverter circuit. By adoption of the transient pulse width broadening circuit and method provided by the invention, the transient pulse width can be effectively broadened, which is conducive to improving the detection accuracy of the transient pulses by the subsequent circuit.

Description

technical field [0001] The invention relates to the technical field of digital circuits, in particular to a transient pulse width stretching circuit and method. Background technique [0002] After high-energy particles are incident on semiconductor materials, they will cause target materials to ionize and deposit charges on the track; this will cause performance degradation or functional failure of semiconductor devices or integrated circuits. This phenomenon is collectively known as single event effect (SEE). Single-event transient pulse refers to the phenomenon that the charge generated on the particle trajectory is collected by the sensitive node and causes instantaneous changes in voltage and current. At present, single-event transient pulses have become the focus of attention at home and abroad. In the test measurement process, the traditional single event transient pulse detection method relies on high-precision measuring instruments to capture the waveform and width ...

AI Technical Summary

Problems solved by technology

In the experimental measurement process, the traditional single event transient pulse detection method relies on high-precision measuring instruments to capture the waveform and width of the transient pulse in the complex circuit system, but because the single event transient pulse width is very small, generally within It is less than 1ns, so the requirements for measuring instruments are high, and the single event transient pulse waveform will be distorted by the influence of drift capacitance when passing through the measuring instrument, so the error of detecting single event transient pulse by this method is relatively large

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