Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for measuring vector transmission matrix of scattering medium

A measurement device and vector technology, applied in the direction of transmittance measurement, etc., can solve the problems of complex experimental devices, without considering the polarization characteristics of scattering media, etc., and achieve the effect of reducing phase measurement errors

Active Publication Date: 2019-08-20
SHANDONG NORMAL UNIV
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, most methods do not take into account the polarization properties of the scattering medium
Although some of these works have proposed some methods for measuring vector transmission matrix (VTM), these measurement methods require relatively complicated experimental devices, and also involve the rotation control of phase shifting devices and polarizing devices during the measurement process.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring vector transmission matrix of scattering medium
  • Device and method for measuring vector transmission matrix of scattering medium
  • Device and method for measuring vector transmission matrix of scattering medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0019] figure 1 It is the experimental device established by the present invention.

[0020] This embodiment provides a kind of medium vector transmission matrix measuring device, wherein the most important part of the system is the vector spatial light modulation unit (VSLM), the unit structure is very simple, only by a traditional SLM and a small angle birefringent polarizer Beam splitter BBS composition. The VSLM is placed on the front focal plane of the Fourier lens FL and illuminated with a collimated laser beam. The light passing through the VSLM and the lens FL is divided into two paths by the first beam splitting prism BS1 and enters the Mach-Zehnder interference system composed of BS1, the second beam splitting prism BS2, the first mirror M1, and the second mirror M2. The light path passing through the mirror M1 is the object light path, and...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a measurement device of a vector transmission matrix of a scattering medium. The measurement device comprises a vector space light modulation unit, a fourier lens, Mach-Zehnder interference system, an image sensor and computing equipment, wherein the vector space light modulation unit comprises a transmission space light modulator and a small-angle birefringence polarization light splitter; light transmitting through the vector space light modulation unit and the fourier lens is divided into two beams of by a first light splitter prism to enter the Mach-Zehnder interference system and further reaches a recording surface of the image sensor; the beams reaching the recording surface generate interference to form a dual-channel angular multiplexing polarization hologram; and the computing equipment obtains complex amplitude and polarization information of a scattering light field of a sample to be measured and furthers calculates the vector transmission matrix by using the dual-channel angular multiplexing polarization hologram. The vector transmission matrix can be measured quickly and accurately based on the device.

Description

technical field [0001] The invention relates to digital holographic imaging, in particular to a measuring device for scattering medium vector transmission matrix. Background technique [0002] The transport of light through scattering media (SM) is a fundamental problem in physics. Especially in the field of wavefront measurement and imaging research, such as in deep tissue imaging, optical focusing through turbid media, and fiber optic imaging, when the amplitude and phase information of the light wave front passes through the scattering medium, the scattering effect of the scattering medium on the light will give the image The recovery and acquisition of information poses great difficulties. An effective way to overcome this difficulty is to use the transmission matrix (TM), which characterizes the definite relationship between the input light field and the scattered light field passing through the SM, to eliminate the influence of SM on imaging. In recent years, a large...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/59
Inventor 国承山谢一言王本义程振加岳庆炀
Owner SHANDONG NORMAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com