Scattering parameter test circuit and method suitable for long delay device
A device and test signal technology, which is applied in the direction of measuring electrical variables, measuring resistance/reactance/impedance, instruments, etc., can solve problems such as intermediate frequency signal errors, failure to obtain test signals, and inability to correspond data correctly, so as to avoid data errors, The effect of precise testing
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Embodiment 1
[0037] Such as figure 1 As shown, a scattering parameter test circuit suitable for long-delay devices includes a signal excitation unit, a local oscillator unit, a reference signal (R) receiving unit, a test signal (A) receiving unit, a digital and arithmetic processing unit, and an embedded Computer, clock and synchronous trigger unit and data information processing unit based on time identity mapping;
[0038] Under the control of the embedded computer, the excitation signal generated by the signal excitation unit is divided into two channels, one is input to the reference signal receiving unit, and the other is input to the measured long-delay device; the local oscillator signal generated by the local oscillator unit is divided into two One way is input to the reference signal receiving unit, and the other is input to the test signal receiving unit; the reference signal (R) receiving unit receives the excitation signal and the local oscillator signal, and generates a refere...
Embodiment 2
[0040] On the basis of the above embodiments, the present invention also mentions a method for accurately testing scattering parameters suitable for long-delay devices, which specifically includes the following steps:
[0041] Step 1: Obtain the information (amplitude / phase / time delay) of the reference signal R;
[0042] Under the control of the embedded computer, the reference signal receiving unit receives the excitation signal from the signal excitation unit and the local oscillation signal of the local oscillation unit, and generates the signal carrying the characteristic information of the excitation signal in a frequency conversion mode under the state of phase-locked synchronization and trigger control. Refer to the intermediate frequency signal, input the intermediate frequency signal to the digital and arithmetic processing unit for digital processing and reference information extraction, and obtain the characteristic information data accurately mapped with the referen...
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