Efficient auto-test system and method for RAID (redundant array of independent disks) card

An automatic test system and automatic test technology, applied in the detection of faulty computer hardware, etc., can solve the problems of complex RAID card testing, large influence of test results test engineers, and long time-consuming, so as to reduce time and labor costs, improve Product competitiveness and the effect of improving test efficiency

Inactive Publication Date: 2017-09-05
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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Problems solved by technology

[0005] In actual use, the RAID card often appears unstable, and the test of the RAID card is often complicated, and it is difficult to achieve a detection rate of 100%.
At present, there are many Raid card test items, and each item is basically based on manua

Method used

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  • Efficient auto-test system and method for RAID (redundant array of independent disks) card

Examples

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Example Embodiment

[0023] Examples:

[0024] The high-efficiency RAID card automatic test method described in this embodiment mainly includes four parts: AC / DC reboot test, Raid card test, automatic alarm, and hardware Power supply monitoring.

[0025] First, the AC / DC reboot test passes a raid card automatic test system, which includes a server, a fatigue machine, and a power supply test device; the power supply test device has a built-in SNMP protocol specification.

[0026] As attached figure 1 As shown, the fatigue machine is powered by AC 220V, and its internal relay supplies power to the server through Server 220V; at the same time, the fatigue machine is provided with Power button output and Power 5V input, both of which are connected to the corresponding interfaces of the server.

[0027] The fatigue machine turns on the server through the Power button output. After it is turned on, the server automatically calls the shutdown script to automatically shut down, and the shutdown time can be set by...

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Abstract

The invention discloses an efficient auto-test system and method for an RAID (redundant array of independent disks) card and relates to the field of server hardware test. An architecture comprises a server, a fatigue machine, and a power supply test device; the fatigue machine is powered by AC 220 V, an inner relay of the fatigue machine supplies power to the server through server 220 V; meanwhile, the fatigue machine is equipped with power button output and power 5 V input both connected to corresponding interfaces of the server; the power supply test device is connected to a reserved measurement and power interface of the RAID card in order to monitor voltage in real time. The system and method have the advantages that RAID card testing time cost and manpower cost are greatly decreased, RAID card test coverage is widened, RAID cards that having hidden operating hazards are screened out in advance, and product quality is improved.

Description

technical field [0001] The invention relates to the field of server hardware testing, in particular to an efficient RAID card automatic testing system and method. Background technique [0002] RAID is a technology that combines multiple independent physical hard disks in different ways to form a logical hard disk, thereby providing higher performance and data redundancy than a single hard disk. The RAID card is a component that implements this function on the server, providing the server with the functions of increasing IO throughput and realizing data redundancy. [0003] The design of the server Raid card is relatively complicated, but due to the structural space of the server, it often involves a standard PCIe half-height structure size. In the extremely limited board space, there are controllers, memory chips, flash chips and other chips with large packages, many pins, and complex functions. This is a great challenge to the signal routing quality and reliability of the ...

Claims

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Application Information

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IPC IPC(8): G06F11/22
Inventor 刘栋张国强
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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