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Substrate conveying system, substrate detection equipment and detection method

A substrate detection and substrate technology, used in lighting and heating equipment, conveyors, conveyor objects, etc., can solve problems such as false detection or missed detection, and inability to detect substrates, and achieve the effect of improving accuracy

Active Publication Date: 2017-09-15
BOE TECH GRP CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This detection method is also susceptible to false detection or missed detection due to the cleanliness of the substrate, and is also susceptible to false detection or missed detection due to the cleanliness of the sensor.
[0005] In summary, the prior art is susceptible to false detection or missed detection due to the influence of substrate or sensor cleanliness when detecting substrate damage, or the detection range is only at the edge of the substrate and cannot detect the overall damage of the substrate

Method used

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  • Substrate conveying system, substrate detection equipment and detection method
  • Substrate conveying system, substrate detection equipment and detection method
  • Substrate conveying system, substrate detection equipment and detection method

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Embodiment Construction

[0038] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0039] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0040] Those skilled in the art will understand that unless otherwise stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. The expression "and / or" used herein includes all or any elements and all combinations of one or more associated lis...

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Abstract

The invention discloses a substrate conveying system, substrate detection equipment and a detection method. The equipment comprises two parallel electrodes, a power supply unit connected to two electrodes and used for loading alternating voltage into the two electrodes, a detection unit connected to the power supply unit and any electrode and used for detecting current value in circuits connected thereto and determining whether a substrate is broken or not according to a first current value detected when the to-be-detected substrate is located between the two electrodes. The substrate conveying system and substrate detection equipment and the detection method have the following beneficial effects: the overall damage of the substrate can be detected; and the detection result is prevented from being affected by cleanliness of the substrate or cleanliness of a sensor, thereby improving accuracy of the detection result.

Description

technical field [0001] The invention relates to the technical field of liquid crystal display, in particular to a substrate conveying system, substrate detection equipment and detection method. Background technique [0002] Liquid crystal display devices are more and more widely used in daily life. At present, the liquid crystal display and touch device manufacturing industry usually uses transparent glass with a material thickness of 0.4-1.1 mm as the substrate of the liquid crystal display device. Due to its brittle nature, it is prone to cracking during substrate transfer. A damaged substrate will seriously damage the conveying device, and it also has a huge risk of damage to the coating equipment and exposure equipment. Therefore, the detection of damaged substrates is particularly important. Currently known substrate damage detection technologies mainly include the following two types: [0003] One is an image analysis-type detection technology: the substrate is imag...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13B65G49/06B65G43/08
CPCG02F1/1309B65G43/08B65G49/063B65G2203/04B65G49/064G01N27/24
Inventor 李明龙王志强陈荣龙马纪艳殷鹏飞高鸿飞
Owner BOE TECH GRP CO LTD
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