Sample fixing platform and freeze scanning electron microscope containing same

A sample fixing and sample technology, which is applied to circuits, discharge tubes, electrical components, etc., can solve the problem of not being able to fix multiple blade samples at the same time, and achieve the effects of short experiment time, reduced economic cost, and improved experiment efficiency.

Inactive Publication Date: 2017-09-22
INST OF GENETICS & DEVELOPMENTAL BIOLOGY CHINESE ACAD OF SCI
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  • Abstract
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  • Application Information

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Problems solved by technology

[0011] The purpose of the present invention is to provide a sample fixing table and a cryo-scanning electron microscope containing it, aiming to solve the technical problem that the sample fixing table of the cryo-scanning electron microscope cannot fix multiple blade samples at the same time in the prior art

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  • Sample fixing platform and freeze scanning electron microscope containing same
  • Sample fixing platform and freeze scanning electron microscope containing same
  • Sample fixing platform and freeze scanning electron microscope containing same

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Embodiment Construction

[0032] Embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings and examples. The following examples are used to illustrate the present invention, but should not be used to limit the scope of the present invention.

[0033] In the description of the present invention, unless otherwise specified, "plurality" means two or more; unless otherwise specified, "notch-shaped" means a shape other than an even cross-section. The orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner", "outer", "front end", "rear end", "head", "tail" etc. is Based on the orientation or positional relationship shown in the drawings, it is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and th...

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Abstract

The invention relates to the technical field of sample fixing devices, and specifically relates to a sample fixing platform. The sample fixing platform comprises a base and a cylinder arranged on the base, wherein a plurality of sample placing positions are arranged at the upper end of the cylinder; and fixing parts for fixing samples are arranged on the sample placing positions. The invention also relates to a freeze scanning electron microscope containing the sample fixing platform. According to the sample fixing platform and the freeze scanning electron microscope containing the sample fixing platform provided by the invention, a plurality of fixing parts are arranged at the upper end of the cylinder, and a plurality of samples such as blades can be fixed simultaneously, so that the consumed time for experiments is short, the experiment efficiency is greatly improved, and the economic cost in the experimental process is also reduced.

Description

technical field [0001] The invention relates to the technical field of sample fixing devices, in particular to a sample fixing platform and a cryo-scanning electron microscope comprising the same. Background technique [0002] Cryo-SEM is a microscopic morphology observation method developed on the basis of scanning electron microscopy. Its resolution is between that of transmission electron microscopy and optical microscopy. It can directly perform microscopic imaging of metals, chemicals, and high-water biomedical materials. One of the important research tools in the field of life. The interior of the scanning electron microscope chamber is a vacuum environment. If a biological sample with high water content is directly placed in the sample chamber, it will cause the sample to lose water and deform, which will affect the original shape information. The technical level of the operator is high, and the repeatability of the experiment is poor. The cryo-scanning electron mic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/20H01J37/28G01N23/22
CPCG01N23/2204H01J37/20H01J37/28H01J2237/201
Inventor 田彦宝
Owner INST OF GENETICS & DEVELOPMENTAL BIOLOGY CHINESE ACAD OF SCI
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