X-ray fluorescence spectrum analysis instrument
A fluorescence spectrum and X-ray technology, which is applied in the field of elemental analysis equipment, can solve the problems of image distortion of the sample taken by the camera, and achieve the effect of precise adjustment and improved detection accuracy
Inactive Publication Date: 2017-10-03
SUZHOU LANSCI INSTR
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- Abstract
- Description
- Claims
- Application Information
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Problems solved by technology
[0004] The technical problem to be solved by the present invention is: in order to solve the technical problem of the distortion of the sample image captured by the camera in the X-ray fluorescence spectrometer, provide an X-ray fluorescence spectrometer with accurate sample image captured by the camera and without affecting the original function
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[0037] This embodiment provides an X-ray fluorescence spectrum analyzer, including:
[0038] Shell 1
[0039] The cover 2 is hingedly arranged on the housing 1 and can be closed or opened;
[0040] The sample stage 41 is set on the top of the housing 1 with a sample detection hole 411 in the middle. The sample detection hole 411 can be set on a detachable sample placement plate to facilitate the replacement of the placement plate. The detection hole 411 is also provided with a mylar membrane;
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Abstract
The invention relates to an X-ray fluorescence spectrum analysis instrument. An X-ray source is arranged at the bottom of a detection cabin; X rays emitted by the X-ray sources are irradiated onto a sample at a vertical angle; the detection precision is improved; meanwhile, a collimation component with a reflecting mirror is installed; when the sample position observation through a camera is needed, a collimation block can be positioned in the observation position through a linear motor; at the moment, a sample can be observed through the camera; the shot image cannot generate deformation distortion; the product imaging and position regulation is more precise and accurate; after the sample position regulation is completed, the collimation block is in the detection position through the linear motor; at the moment, the X-ray detection can be performed through the X rays emitted through the X-ray source; the X-ray detection function is not influenced.
Description
Technical field [0001] The invention relates to an X-ray fluorescence spectrum analyzer, which belongs to the technical field of element analysis equipment. Background technique [0002] The atom of any element is composed of a nucleus and electrons moving around the nucleus. The electrons outside the nucleus form different energy levels according to their energy levels. Therefore, a nucleus can have multiple energy levels. The energy level with the lowest energy is called the ground state energy level, the remaining energy levels are called the excited state energy levels, and the excited state with the lowest energy is called the first excited state. Under normal circumstances, the atom is in the ground state, and the electrons outside the core move on the orbits with their lowest energy. If a certain external energy such as light energy is provided to the ground state atom, when the external light energy E is exactly equal to the energy level difference △E between the ground ...
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IPC IPC(8): G01N23/223
CPCG01N23/223
Inventor 杜亚明
Owner SUZHOU LANSCI INSTR