Fixing device and fixing method for high-temperature particle irradiation sample

Abstract

The invention discloses a fixing device for a high-temperature particle irradiation sample and a fixing method thereof. The fixing device comprises a sample clamp which is fixed in an irradiation device through a bracket, wherein the sample clamp has a vertical flat plate structure; a plurality of arc-shaped hollow guide rails which are centrosymmetric about the panel center are arranged on a plate; the radian of the arc-shaped hollow guide rails is bent away from the plate center; a screw is penetrated through each of the arc-shaped hollow guide rails, is equipped with a matched nut and is screwed for locking a matched gasket; the gasket is used for pressing a copper sheet on the plate of the sample clamp; the edge of the sample is pressed by the copper sheet; and the copper sheets corresponding to all the arc-shaped hollow guide rails are matched with each other so as to fix the sample on the sample clamp. The fixing device disclosed by the invention adopts a screw and copper sheet combined fixing method for effectively avoiding the problem of the reducing of conductive adhesiveness under high temperature, the fixing is not influenced by the smoothness of the sample surface, the gravity influence endured by the sample is counteracted, the adverse factor of the reducing of the conductive adhesiveness under high temperature is overcome, the test efficiency is increased, the research cost is saved and the device is more firm, efficient and environmentally friendly.

Description

technical field [0001] The invention relates to a particle irradiation experiment equipment, in particular to a fixing device and a fixing method for a particle irradiation sample. Background technique [0002] In recent years, high-energy particle irradiation technology has been increasingly applied to the field of material research. At present, the commonly used irradiated particles include ions, neutrons and protons. Using different particles to conduct high-energy particle irradiation tests on materials has been widely used in the field of material research, especially in the field of simulated irradiation research on metal materials for nuclear power. [0003] No matter what kind of particle irradiation is used, the key issue of "how to put materials into the irradiation terminal to achieve particle irradiation" cannot be avoided. In general, for radiation tests at room temperature, ordinary conductive adhesives can meet the sample fixing requirements. Conductive adhe...

AI Technical Summary

Problems solved by technology

[0004] (1) The bonding strength of conductive adhesives at high temperatures is relatively low, and as the temperature increases, its bonding performance will also decrease;

[0005] (2) The bonding strength is affected by the surface finish of the sample, which cannot meet the bonding requirements of samples with rough surfaces and complex shapes;

[0006] (3) During the test, the sample fixture and the sample are vertically placed into the irradiation terminal, and the sample itself is subjected to gravity, and the sample is easy to fall off under the impact of high-temperature particles;

[0007] (4) Particle irradiation under long-term and harsh conditions will reduce the bond strength of the conductive adhesive

[0008] During the high-temperature particle irradiation test, when one or more of the above factors appear, the samples bonded with conductive adhesive will loosen or fall off, which will directly lead to the failure of the test and make the test have to be repeated.

Therefore, when the particle irradiation test is carried out under high temperature conditions, the traditional fixing method of conductive adhesive bonding will result in low test efficiency and high cost, and cannot meet the requirements of high temperature particle irradiation tests to a large extent.

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