Fault detection recording method and integrated circuit fault recording system based on PC

A technology of integrated circuit and recording method, which is applied in the direction of measuring electricity, measuring electrical variables, electronic circuit testing, etc., and can solve problems such as complicated operation, no record of fault information, and high upgrade cost

Inactive Publication Date: 2017-10-10
华润赛美科微电子(深圳)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In actual production, if the integrated circuit test equipment breaks down during the test, the operator will deal with the failure without any record of the failure information, so it is impossible to count the failure rate and the failure ra

Method used

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  • Fault detection recording method and integrated circuit fault recording system based on PC
  • Fault detection recording method and integrated circuit fault recording system based on PC
  • Fault detection recording method and integrated circuit fault recording system based on PC

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Embodiment Construction

[0029] like figure 1 What is described is a structural frame diagram of an integrated circuit fault recording system in an embodiment. The integrated circuit fault recording system includes an integrated circuit testing device 10 and a PC 20 , and the PC 20 is connected to the integrated circuit fault recording system 10 .

[0030] Wherein, the integrated circuit testing equipment 10 includes a hardware testing device 110 , an alarm module 120 and an alarm sensing module 130 . The hardware testing device 110 is electrically connected to the alarm module 120 . The hardware testing device 110 is used to test the chip, and when a fault occurs during the test, the alarm module 120 is controlled to give an alarm and transmit the fault information to the PC 20 for display. The alarm sensing module 130 is configured to sense the alarm of the alarm module, and send a notification signal and transmit it to the PC 20 when the alarm is sensed.

[0031] In the process of testing the ch...

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Abstract

The invention relates to a fault detection recording method and an integrated circuit fault recording system based on PC. The method is based on the PC and an integrated circuit testing device. The integrated circuit testing device includes a hardness testing apparatus, an alarm module and an alarm sensing module. The method includes the following steps: controlling the hardness testing apparatus to work; when the hardness testing apparatus has a fault, controlling the alarm module to sound an alarm, and transmitting fault information to the PC for display; controlling the alarm sensing module to sense the alarm from the alarm module, and transmitting a notification signal if the alarm is sensed; a communication module of the PC receiving the notification signal, and intercepting the fault information which is currently displayed upon receiving the notification signal, and saving the intercepted image in accordance with the current intercepting time. The method can automatically record the fault information of the testing apparatus, obviates the need for upgrading original testing apparatus, and saves cost. In addition, the invention also provides an integrated circuit fault recording system based on PC.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a fault detection recording method and a PC-based integrated circuit fault recording system. Background technique [0002] During the final test of integrated circuits, the automatic test equipment (Auto Test Equipment, ATE) in the integrated circuit test equipment performs chip testing by controlling the automatic sorting machine (Handler), and the automatic sorting machine will test the results Recorded on the PC connected to the automatic sorting machine. [0003] In actual production, if the integrated circuit test equipment breaks down during the test, the operator will deal with the failure without any record of the failure information, so it is impossible to count the failure rate and the failure rate of the integrated circuit test equipment. Various failure types. To realize the function of recording fault information, it is necessary to upgrade the i...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R35/00
CPCG01R31/2851G01R35/00
Inventor 顾汉玉
Owner 华润赛美科微电子(深圳)有限公司
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