Fault detection recording method and integrated circuit fault recording system based on PC

Abstract

The invention relates to a fault detection recording method and an integrated circuit fault recording system based on PC. The method is based on the PC and an integrated circuit testing device. The integrated circuit testing device includes a hardness testing apparatus, an alarm module and an alarm sensing module. The method includes the following steps: controlling the hardness testing apparatus to work; when the hardness testing apparatus has a fault, controlling the alarm module to sound an alarm, and transmitting fault information to the PC for display; controlling the alarm sensing module to sense the alarm from the alarm module, and transmitting a notification signal if the alarm is sensed; a communication module of the PC receiving the notification signal, and intercepting the fault information which is currently displayed upon receiving the notification signal, and saving the intercepted image in accordance with the current intercepting time. The method can automatically record the fault information of the testing apparatus, obviates the need for upgrading original testing apparatus, and saves cost. In addition, the invention also provides an integrated circuit fault recording system based on PC.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a fault detection recording method and a PC-based integrated circuit fault recording system. Background technique [0002] During the final test of integrated circuits, the automatic test equipment (Auto Test Equipment, ATE) in the integrated circuit test equipment performs chip testing by controlling the automatic sorting machine (Handler), and the automatic sorting machine will test the results Recorded on the PC connected to the automatic sorting machine. [0003] In actual production, if the integrated circuit test equipment breaks down during the test, the operator will deal with the failure without any record of the failure information, so it is impossible to count the failure rate and the failure rate of the integrated circuit test equipment. Various failure types. To realize the function of recording fault information, it is necessary to upgrade the i...

AI Technical Summary

Problems solved by technology

[0003] In actual production, if the integrated circuit test equipment breaks down during the test, the operator will deal with the failure without any record of the failure information, so it is impossible to count the failure rate and the failure rate of the integrated circuit test equipment. various failure types

To realize the function of recording fault information, it is necessary to upgrade the integrated circuit test equipment, but the upgrade cost is high and the operation is complicated

Images