Method for performing NVME disk reliability test on Rack whole cabinet in batch

Abstract

The invention discloses a method for performing NVME disk reliability test on a Rack whole cabinet in batch. The method is characterized by comprising the following steps: S1, grabbing a drive of an NVME disk in a system; S2, arranging reading strategies of the NVME disk in a conf file required for fio test; S3, invoking the conf file to execute the test by using an fio command and preserving test results; S4, comparing the screened test results with spec NVME disk performances spec; S5, repeating the step S1 to the step S4 till the test on all nodes is completed, and outputting and preserving the test results on all the nodes. The phenomenon whether performance degradation exists or not after long-time reading test on the NVME disk can be effectively discovered in the test, so that problems are discovered and solved in advance at the test stage.

Description

technical field [0001] The invention relates to the technical field of NVME SSD testing, in particular to a method for testing the reliability of NVME disks in batches in a whole Rack cabinet. Background technique [0002] The full name of NVME is Non-Volatile Memory Express, a non-volatile memory standard. It is a specification for SSDs using PCI-E channels. NVME was designed to make full use of the low latency and parallelism of PCI-E SSDs. There is parallelism with contemporary processors, platforms, and applications. SSDs can be fully utilized by the host's hardware and software. The main advantages of NVME disks are lower latency, higher transmission performance, and lower power consumption control. The performance test of NVME disks in the existing technology is to directly perform 4k random read and write, sequential read and write, and 256k random Read and write sequentially, but in mass production, it is found that simply doing 4k read and write and 256k read and ...

AI Technical Summary

Problems solved by technology

The main advantages of NVME disks are lower latency, higher transmission performance, and lower power consumption control. The performance test of NVME disks in the existing technology is to directly perform 4k random read and write, sequential read and write, and 256k random Read and write sequentially, but in mass production, it is found that simply doing 4k read and write and 256k read and write, some disks will have substandard performance. After analysis, it may be due to some kind of instability in the NVME test. status caused

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