Test device for simulation of near-fault seismic oscillation initiated by reverse fault strike-slip movement
A technology of stick-slip dislocation and test equipment, which is applied in the direction of measuring equipment, vibration testing, machine/structural component testing, etc., can solve the problem of inability to effectively simulate the mechanism of stick-slip source of active faults, achieve simple structure, reduce test cost effect
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[0018] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0019] like Figure 1-2 As shown, a test device for simulating the stick-slip dislocation of reverse faults that causes near-fault earthquakes includes a cubic structure test box 1 with an opening on the upper surface, and a movable baffle 5 is arranged on the lower part of one side of the test box 1; the movable baffle 5 is provided with an inner panel 2 extending to the inside of the test box 1, and the movable baffle 5 can slide along the inner panel 2 and the lower surface of the test box 1; The simulated fault 9 on the surface; the upper part of the test box 1 is provided with a simulated tunnel 8 passing through the simulated fault 9; the upper wall 10 is between the side of the simulated fault 9 close to the movable baffle 5 and the inner surface of the test box 1, and simulated Below the fault 9, between the side away from the movable ...
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