Specimen disc positioning device of total reflection X-ray fluorescence spectrophotometer

Abstract

The invention relates to a specimen disc positioning device of a total reflection X-ray fluorescence spectrophotometer, which comprises a specimen disc frame located under a detector, the bottom surface of the specimen disc frame can be horizontally drawn, a specimen disc is horizontally arranged on the bottom surface of the specimen disc frame; a compressing device is arranged under the bottom surface of the specimen disc frame, and horizontal positioning devices are arranged on borders at two sides of the specimen disc frame. The problems of specimen loading and specimen positioning of a total reflection X-ray luminoscope of a horizontal specimen-loading system is solved by the specimen disc positioning device of the total reflection X-ray fluorescence spectrophotometer, which is provided by the invention. The positioning device does not influence the incident light and the emergent light, the structure is simple in operation, and the position is fixed.

Description

technical field [0001] The invention belongs to the design of a total reflection X-ray fluorescence spectrometer, in particular to a sample plate positioning device of a total reflection X-ray fluorescence spectrometer. Background technique [0002] Total reflection X-ray fluorescence spectrometer (TXRF) has high sensitivity (pg-ng), less sample consumption (ng-μg, including micron dust samples), accurate quantification, and samples can be directly and simultaneously analyzed with multiple elements without digestion A series of outstanding advantages. TXRF is small in size and can be taken to the sampling site, and can analyze Pb, S, As and other elements that cannot be analyzed by neutron activation (NAA). [0003] The difference between TXRF and ordinary ED-XRF is that after cutting the reflector, when the X-ray is totally reflected, the intensity of the incident X-ray and the outgoing ray are equal, eliminating the coherent and incoherent scattering of the primary X-ray ...

AI Technical Summary

Problems solved by technology

The total reflection angle of the X-ray fluorescence of the Mo target is 0.1 degrees, and a small position change will cause a large error. Therefore, the accuracy of the sample holder and positioning device is strictly required.

[0005] The sample tray of Bruker’s TXRF instrument is placed vertically, and the fixed sample tray adopts a clip-type fixing method. The sample rack is pulled out, and the sample rack is sent in for measurement after loading the sample. This loading method is very sensitive to solid dust Difficulty measuring granular samples

[0006] For the horizontal sample loading system, it is not suitable to use the clip-type sample rack and positioning. The sample rack installed in the direction of the incident light and on both sides will affect the incident light to reach the surface of the sample plate, and the direction of the outgoing light will affect the insertion and removal of the sample, which is inconvenient. Instrument debugging

Images