A defect detection method and device

Abstract

Embodiments of the present invention provide a defect detection method and device, which relate to the field of optical automatic defect detection, and can reduce the over-judgment rate of defects through a simple defect detection method. The defect detection method includes collecting the detection picture of the panel to be tested in the first orientation after the panel to be detected displays the detection picture, and obtaining the first quantitative data of the target area in the detection picture; moving the panel to be tested to the second position, and the second The orientation is different from the first orientation; the detection picture of the panel to be detected in the second orientation is collected, and the second quantitative data of the target area in the detection picture is obtained; the target area is determined according to the first quantitative data and the second quantitative data in the same target area actual deficiencies in the

Description

technical field [0001] The invention relates to the field of optical automatic defect detection, in particular to a defect detection method and device. Background technique [0002] At present, in the factory inspection process of LCD (Liquid Crystal Display, liquid crystal display), the AOI (Automatic Optic Inspection, automatic optical inspection) algorithm process is mostly used to detect the defects of the LCD panel. The algorithm process generally includes ROI (Region of Interest, Target area) segmentation and defect quantification are two key steps. Among them, defect quantification is to quantify the brightness difference of the panel under the lighting screen according to a certain benchmark, and determine the nature of the defect through the comparison of quantitative data and the formulation of relevant defect standards. [0003] However, due to defects in the LCD panel, such as Mura (moire phenomenon), the size, area, and shape of the ROI are uncertain, and are ea...

AI Technical Summary

Problems solved by technology

[0003] However, due to defects in the LCD panel, such as Mura (moire phenomenon), the size, area, and shape of the ROI are uncertain, and are easily affected by the environment, especially the light. In the case of a single defect quantization algorithm in the prior art, The quantitative value will not change. Simply changing the detection threshold cannot fundamentally solve the problem of high over-judgment rate caused by defects in the external environment; of course, multi-parameter joint debugging or high-precision cameras can be used method, but the debugging period of this method is long, and changing the model requires re-commissioning, which makes the cost relatively high

Images