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LCD screen Mura defect detection system and method

A defect detection and screen technology, applied in nonlinear optics, instruments, optics, etc., can solve the problems of not being able to simulate the observation effect of the human eye well, the detection results are not ideal, and there is no shape, etc., to achieve rich observation methods, comprehensive cloud grain defects, reducing the effect of movement

Inactive Publication Date: 2017-12-08
SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

like figure 1 As shown, mura defects are generally larger than one pixel, have no fixed shape, blurred edges, and low contrast
Although the purpose of detection is achieved to a certain extent, because the moiré defect is a macro defect, the structure cannot simulate the observation effect of the human eye well, and the detection result is actually not ideal

Method used

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  • LCD screen Mura defect detection system and method
  • LCD screen Mura defect detection system and method
  • LCD screen Mura defect detection system and method

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Embodiment Construction

[0034] The specific embodiments of the present invention are given below in conjunction with the accompanying drawings, but the present invention is not limited to the following embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in very simplified form and use imprecise ratios, which are only used for the purpose of conveniently and clearly assisting in describing the embodiments of the present invention.

[0035] Please refer to Figure 4 , Figure 4 Shown is a schematic structural diagram of the moiré defect detection system in the first preferred embodiment of the present invention. The present invention proposes an LCD screen moiré defect detection system, comprising: a plane reflector 200, which is arranged on the side of the LCD screen 100 to be detected; and the LCD screen imaging 400 in the plane mirror 200 for shooting; the image processing module pro...

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Abstract

The invention provides an LCD screen Mura defect detection system and method. The LCD screen Mura defect detection system includes: a plane reflective mirror arranged on a side surface of an LCD screen to be detected; a machine vision system which includes a camera and can shoot images of the LCD screen to be detected and an LCD screen in the plane reflective mirror from different angles; an image processing module which can process images acquired by the machine vision system, and recognizes Mura defects. The LCD screen Mura defect detection system and method can observe the screen from different angles, can simulate human eye observation to the greatest extent, can enrich the observation manners of an image acquisition system, can detect the Mura defects roundly, can satisfy the demand of multi-angle observation, can reduce movement of the image acquisition system and the screen to be detected, can greatly lower the complexity of the system, and can enhance the stability of the system.

Description

technical field [0001] The invention relates to the field of LCD screen defect detection, and in particular to an LCD screen moiré defect detection system and method. Background technique [0002] In the entire LCD production process, in order to ensure the yield rate, almost every important process must be inspected for its completion quality. For example, after the Cell manufacturing process, it is necessary to use a connector to connect the driving signal to the LCD screen to detect defects, chromaticity, color stripes, contrast, etc. However, after the assembly of the liquid crystal display module is completed, it is still necessary to detect various images or image indicators of the display screen through lighting. [0003] The display defects of TFT LCD are various. Mura (moire) defect is a common macroscopic display defect of LCD, and is one of the most difficult types of all display defects to detect. The description of Mura in the SEMI standard is: When the displ...

Claims

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Application Information

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IPC IPC(8): G02F1/13G09G3/00
Inventor 林彬张俊
Owner SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD
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