Microcomputer protection test system
A microcomputer protection test and test frame technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of unusable ports, inability to detect, and affect the qualified rate of equipment leaving the factory, so as to prolong the service life and friction The effect of reduction and long service life
Active Publication Date: 2017-12-15
SHANGHAI JUREN ELECTRIC POWER TECH
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Problems solved by technology
The existing test system usually detects the operation of the entire device or whether each component inside the device is normal, but it cannot detect whether these wiring ports on the device are normal, so when the device is put into use, there are some ports. Unusable conditions will affect the qualified rate of equipment ex-factory
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[0019] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention.
[0020] Such as figure 1 Shown, a kind of microcomputer protection test system, comprises test equipment and the test frame 1 that cooperates with described test equipment, wherein is existing microcomputer test equipment at described test equipment, so no longer repeat them here; Said test The frame 1 includes a frame body 11, an interface group 111 arranged on the frame body 11 and a fuse group 112 matched with the interface group 111, the interface group 111 is a plurality of interfaces distributed at intervals, and the insurance Tube group 112 is a plurality of safety tubes distributed at intervals; a test station 2 for placing the microcomputer to be tested is provided on...
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The present invention discloses a microcomputer protection test system which comprises test equipment, a test rack matched with the test equipment, a test station, a first test device which can move back and forth and is arranged at one side of the test station, a second test device which can move back and forth and is arranged at the other side of the test station, a first driving element for driving the first test device to move back and forth, a second driving element for driving the second test device to move back and forth, a third test device which is arranged at the same side of the second test device, and a control device. The test equipment, the test rack, the first test device, the second test device and the third test device are electrically connected to the control device. According to the system, whether the connection of an equipment interface is normal or not can be detected, thus unqualified equipment caused by a connection failure of the equipment interface is avoided, and the qualification rate of the equipment is improved.
Description
technical field [0001] The invention belongs to the technical field of test systems, in particular to a microcomputer protection test system. Background technique [0002] The microcomputer protection measurement and control device is composed of high-integration, bus-out chip single-chip microcomputer, high-precision current and voltage transformer, high-dielectric strength export intermediate relay, high-reliability switching power supply module and other components. It is an economical protection for the integration of measurement, control, protection and communication. The microcomputer protection measurement and control device has protection functions such as incoming line protection, outgoing line protection, section protection, distribution transformer protection, motor protection, capacitor protection, main transformer backup protection, generator backup protection, and PT monitoring protection. [0003] Its complex functions make it have a lot of wiring ports on it...
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IPC IPC(8): G01R31/00G01R1/073
CPCG01R1/07314G01R31/00
Inventor 吴江华王峰邓龙
Owner SHANGHAI JUREN ELECTRIC POWER TECH