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Trench gate structure and fabrication method thereof

A technology of trench gates and manufacturing methods, which is applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., and can solve problems such as limited applications

Active Publication Date: 2017-12-29
CSMC TECH FAB2 CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, its disadvantage is that it is limited by the technology of trench depth, polysilicon thickness, contact hole depth, etc., which limits the application of this traditional solution.

Method used

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  • Trench gate structure and fabrication method thereof
  • Trench gate structure and fabrication method thereof
  • Trench gate structure and fabrication method thereof

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Embodiment Construction

[0022] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. A preferred embodiment of the invention is shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0023] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0024] It sho...

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Abstract

The present invention relates to a trench gate structure and a fabrication method thereof. The trench gate structure includes a substrate, a trench on the surface of the substrate, an insulating liner on the substrate, a gate oxide layer on the inner surface of the trench, and a polysilicon gate on the gate oxide layer; the insulating liner adjoins the trench through the ramp structure of the insulating liner; the polysilicon gate extends along the ramp structure from the trench to the insulating liner; the insulating liner comprises a polysilicon gate lifting region which is recessed relative to the other portions of the liner; and the polysilicon gate extending out from the trench is supported on the polysilicon gate lifting region. According to the trench gate structure of the invention, a portion of the polysilicon gate in the trench is independent from a portion of the polysilicon gate which extends to the insulating liner, and therefore, the depth of the trench and the depth of a contact hole will not limit each other. The photo-etching of the polysilicon gate and polysilicon photo-etching of a device are performed in the same step, and therefore, additional photo-etching masks and photo-etching layers are not needed to be adopted, and cost increase can be avoided.

Description

technical field [0001] The invention relates to semiconductor manufacturing technology, in particular to a trench gate structure and a manufacturing method of the trench gate structure. Background technique [0002] Due to cost reasons, traditional trench-type vertical double-diffused metal-oxide-semiconductor field effect transistor (VDMOS) products mostly adopt the method of increasing the end size of the lead-out trench and punching contact holes on it to lead out the trench gate structure. ,Such as figure 1 shown. The advantage of this solution is that it can use the existing mask layer of the product process, without increasing the cost of the mask layer. However, its disadvantage is that it is limited by the technology such as trench depth, polysilicon thickness, and contact hole depth, which limits the application of this traditional solution. Contents of the invention [0003] Based on this, it is necessary to provide a relatively more flexible trench gate struc...

Claims

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Application Information

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IPC IPC(8): H01L21/28H01L29/40H01L29/423H01L29/78
CPCH01L21/28008H01L21/28017H01L29/4236H01L29/7802H01L29/42376H01L29/4238H01L29/66704H01L29/66734H01L29/7813H01L29/7825H01L21/0337H01L21/76897H01L29/42364
Inventor 卞铮
Owner CSMC TECH FAB2 CO LTD
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