Time sequence parameter scanning method and apparatus

A parameter and timing technology, applied in the field of communication

Inactive Publication Date: 2018-01-05
BEIJING XINWEI TELECOM TECH
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Problems solved by technology

[0004] The purpose of the embodiments of the present invention is to propose a timing parameter scanning method and

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  • Time sequence parameter scanning method and apparatus
  • Time sequence parameter scanning method and apparatus

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Embodiment Construction

[0079] The embodiments of the present invention will be further described in detail below in conjunction with the drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the embodiments of the present invention, rather than to limit the embodiments of the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all structures related to the embodiments of the present invention.

[0080] refer to figure 1 , figure 1 It is a schematic flowchart of a timing parameter scanning method provided by an embodiment of the present invention.

[0081] Such as figure 1 As shown, the method of timing parameter scanning includes:

[0082] Step 101, initializing the Synchronous DRAM, configuring multiple sets of timing parameters, and traversing each set of timing parameters;

[0083] Step 102, execute a direct memory access controller (Direct Memory Acc...

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Abstract

The invention discloses a time sequence parameter scanning method and apparatus. The method comprises the steps of initializing a synchronous dynamic random access memory, configuring multiple groupsof time sequence parameters, and traversing each group of the time sequence parameters; performing DMAC (Direct Memory Access Controller) reading detection on different traversed time sequence parameters to obtain the time sequence parameters corresponding to correct reading/writing of data of the synchronous dynamic random access memory; and selecting a group of optimal time sequence parameters from the obtained time sequence parameters through data line and address line detection and minimum time sequence parameter delay principles. The time sequence parameters of the synchronous dynamic random access memory are scanned by adopting a scanning algorithm of a DMAC, so that error data is prevented from being sampled by single reading operation, the optimal time sequence parameters of the synchronous dynamic random access memory can be directly, accurately and quickly found, and the time sequence parameters are more stable and reliable; and a conventional March_C algorithm is improved, so that errors of a data line and an address line of the synchronous dynamic random access memory can be detected more effectively, and the fault detection range is wider.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of communications, and in particular, to a method and device for scanning timing parameters. Background technique [0002] The traditional March_C algorithm is widely used in memory testing and has relatively good test results. The traditional March_C algorithm is very effective in detecting jumping faults, stuck faults and most coupling faults. However, there are some deficiencies in the detection of memory cell coupling faults and address opening faults or addressing faults, such as cell coupling faults: for two small cells sticking together, simultaneous and same direction jumps cannot be detected, and two small cells cannot be stored If the value is opposite, the value to be stored will not be stored correctly; for example, address opening fault: two adjacent address bits will be selected at the same time, and the same address will be written every time the write operation is perfo...

Claims

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Application Information

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IPC IPC(8): G11C29/10
Inventor 杨永玲谭亚伟
Owner BEIJING XINWEI TELECOM TECH
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