New self-cleaning SEM handle

Abstract

The invention provides a novel self-cleaning scanning electron microscope handle, and relates to the technical field of scanning electron microscope equipment. The novel self-cleaning scanning electron microscope handle comprises a base. A scanning electron microscope body is fixedly connected with the top of the base, a side of the scanning electron microscope body is sequentially provided with ahandle body and a fixing groove from top to bottom, a drawer is slidably connected into a notch of the fixing groove, a support plate is fixedly connected with the top of the scanning electron microscope body, a transverse plate and an electric push rod are sequentially fixedly connected with a side of the support plate from top to bottom, and a first slide rail is fixedly connected with the bottom of the transverse plate. The novel self-cleaning scanning electron microscope handle has the advantages that the novel self-cleaning scanning electron microscope handle is provided with a sweepingdevice, effects of adjusting the sweeping device can be realized under the effect of the electric push rod by the first slide rail, a slider, second slide rails, a connecting plate, a miniature motor,a lead screw, a screw sleeve, barriers, pressure sensors, a limit ring and balls in the structural designs, and accordingly the handle body can be conveniently swept by the sweeping device.

Description

technical field [0001] The invention relates to the technical field of scanning electron microscope equipment, in particular to a novel self-cleaning scanning electron microscope handle. Background technique [0002] A scanning electron microscope is a new type of electron optical instrument. It has the characteristics of simple sample preparation, wide adjustable range of magnification, high image resolution and large depth of field. For decades, scanning electron microscopy has been widely used in the fields of biology, medicine, metallurgy and other disciplines, and has promoted the development of various related disciplines. In the scanning electron microscope, it is not only possible to use the incident electrons to interact with the sample to generate various information for imaging, but also to obtain a variety of special display methods for images through signal processing methods, and to obtain information from the surface topography of the sample. Various informa...

AI Technical Summary

Problems solved by technology

[0006] Aiming at the deficiencies of the prior art, the present invention provides a novel self-cleaning SEM handle, which solves the problem of contamination of the SEM handle when taking and placing samples

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